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Recent advances in imaging of properties and growth of low dimensional structures for photonics and electronics by XPEEM

Zakharov, Alexei LU ; Mikkelsen, Anders LU and Andersen, Jesper N LU (2012) In Journal of Electron Spectroscopy and Related Phenomena 185(10). p.417-428
Abstract
Spectroscopic Photoemission and Low Energy Electron Microscopy (SPELEEM) is a very powerful and diverse microscopy technique for the investigation of surfaces, interfaces, buried layers and nanoscale objects like nanoparticles and nanowires. The many significant results from photoemission Electron microscopy (PEEM) in recent years are linked with the exploitation of advanced light sources such as synchrotrons and new advanced laser systems. Combined also with low energy electron microscopy (LEEM) it allows a complementary chemical and structural analysis making LEEM/PEEM a versatile multitechnique instrument. To illustrate the extreme diversity, we give a summary of the recent studies with the SPELEEM installed at the soft X-ray beamline... (More)
Spectroscopic Photoemission and Low Energy Electron Microscopy (SPELEEM) is a very powerful and diverse microscopy technique for the investigation of surfaces, interfaces, buried layers and nanoscale objects like nanoparticles and nanowires. The many significant results from photoemission Electron microscopy (PEEM) in recent years are linked with the exploitation of advanced light sources such as synchrotrons and new advanced laser systems. Combined also with low energy electron microscopy (LEEM) it allows a complementary chemical and structural analysis making LEEM/PEEM a versatile multitechnique instrument. To illustrate the extreme diversity, we give a summary of the recent studies with the SPELEEM installed at the soft X-ray beamline 1311 at the MAXII synchrotron storage ring and a portable electrostatic PEEM used with ultra-fast XUV laser technology. The examples cover topics such as full-cone 3D band mapping by using the photoelectron diffraction mode of the microscope, growth mechanism and detailed doping profile of III-V nanowires, growth and intercalation of graphene on SiC substrates, droplet dynamics on GaP(1 1 1) surface, surface chemistry and control of nanostructure fabrication. Moreover, the first results of PEEM experiments using extreme ultraviolet attosecond pulse trains are discussed. (C) 2012 Elsevier B.V. All rights reserved. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
XPEEM, Nanowires, Graphene, Droplet dynamics, Short-pulse laser
in
Journal of Electron Spectroscopy and Related Phenomena
volume
185
issue
10
pages
417 - 428
publisher
Elsevier
external identifiers
  • wos:000312979400014
  • scopus:84870054870
ISSN
0368-2048
DOI
10.1016/j.elspec.2012.03.002
language
English
LU publication?
yes
id
7375b6af-320c-41a5-8594-6044d53e9e66 (old id 3511102)
date added to LUP
2013-02-21 12:05:04
date last changed
2017-01-01 05:57:42
@article{7375b6af-320c-41a5-8594-6044d53e9e66,
  abstract     = {Spectroscopic Photoemission and Low Energy Electron Microscopy (SPELEEM) is a very powerful and diverse microscopy technique for the investigation of surfaces, interfaces, buried layers and nanoscale objects like nanoparticles and nanowires. The many significant results from photoemission Electron microscopy (PEEM) in recent years are linked with the exploitation of advanced light sources such as synchrotrons and new advanced laser systems. Combined also with low energy electron microscopy (LEEM) it allows a complementary chemical and structural analysis making LEEM/PEEM a versatile multitechnique instrument. To illustrate the extreme diversity, we give a summary of the recent studies with the SPELEEM installed at the soft X-ray beamline 1311 at the MAXII synchrotron storage ring and a portable electrostatic PEEM used with ultra-fast XUV laser technology. The examples cover topics such as full-cone 3D band mapping by using the photoelectron diffraction mode of the microscope, growth mechanism and detailed doping profile of III-V nanowires, growth and intercalation of graphene on SiC substrates, droplet dynamics on GaP(1 1 1) surface, surface chemistry and control of nanostructure fabrication. Moreover, the first results of PEEM experiments using extreme ultraviolet attosecond pulse trains are discussed. (C) 2012 Elsevier B.V. All rights reserved.},
  author       = {Zakharov, Alexei and Mikkelsen, Anders and Andersen, Jesper N},
  issn         = {0368-2048},
  keyword      = {XPEEM,Nanowires,Graphene,Droplet dynamics,Short-pulse laser},
  language     = {eng},
  number       = {10},
  pages        = {417--428},
  publisher    = {Elsevier},
  series       = {Journal of Electron Spectroscopy and Related Phenomena},
  title        = {Recent advances in imaging of properties and growth of low dimensional structures for photonics and electronics by XPEEM},
  url          = {http://dx.doi.org/10.1016/j.elspec.2012.03.002},
  volume       = {185},
  year         = {2012},
}