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Scanning Photoelectron Spectro-Microscopy : A Modern Tool for the Study of Materials at the Nanoscale

Zeller, Patrick; Amati, Matteo; Sezen, Hikmet; Scardamaglia, Mattia; Struzzi, Claudia LU ; Bittencourt, Carla; Lantz, Gabriel; Hajlaoui, Mahdi; Papalazarou, Evangelos and Marino, Marsi, et al. (2018) In Physica Status Solidi (A) Applications and Materials Science 215(19).
Abstract

The advanced properties of modern materials originate from their nanoscale size and shape and from chemical modifications or doping. Special techniques that can measure the chemical state in the nanoscale are required for exploration and understanding the properties of these materials. While X-ray photoelectron spectroscopy (XPS) can access the necessary chemical information, conventional setups have no spatial resolution. The scanning photoelectron microscope (SPEM) takes in advent the third generation synchrotron radiation facilities and uses a zone plate (ZP) focusing optics that allows spatially resolved XPS measurements in the submicron scale. Several recent examples of investigations of chemically modified or doped nanomaterials... (More)

The advanced properties of modern materials originate from their nanoscale size and shape and from chemical modifications or doping. Special techniques that can measure the chemical state in the nanoscale are required for exploration and understanding the properties of these materials. While X-ray photoelectron spectroscopy (XPS) can access the necessary chemical information, conventional setups have no spatial resolution. The scanning photoelectron microscope (SPEM) takes in advent the third generation synchrotron radiation facilities and uses a zone plate (ZP) focusing optics that allows spatially resolved XPS measurements in the submicron scale. Several recent examples of investigations of chemically modified or doped nanomaterials are given. The modification of suspended and supported graphene with nitrogen and fluorine is presented as well as the doping dependent position of the Fermi-level in single GsAs nanowires and the Mott–Hubbard transition in Cr-doped vanadium oxide. These examples show several peculiar SPEM abilities like a high surface and chemical sensitivity and a submicron spatial resolution proving the capability and importance of this technique to study materials at the nanoscale.

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publication status
published
subject
keywords
graphene, Mott–Hubbard transition, scanning photoemission microscopy, semiconductor nanowires, X-ray photoelectron spectroscopy
in
Physica Status Solidi (A) Applications and Materials Science
volume
215
issue
19
publisher
Wiley-Blackwell
external identifiers
  • scopus:85052663123
ISSN
1862-6300
DOI
10.1002/pssa.201800308
language
English
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yes
id
3afe0079-f654-4f68-9283-4ebe4f2641c7
date added to LUP
2018-10-05 14:24:21
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2019-01-14 18:01:37
@article{3afe0079-f654-4f68-9283-4ebe4f2641c7,
  abstract     = {<p>The advanced properties of modern materials originate from their nanoscale size and shape and from chemical modifications or doping. Special techniques that can measure the chemical state in the nanoscale are required for exploration and understanding the properties of these materials. While X-ray photoelectron spectroscopy (XPS) can access the necessary chemical information, conventional setups have no spatial resolution. The scanning photoelectron microscope (SPEM) takes in advent the third generation synchrotron radiation facilities and uses a zone plate (ZP) focusing optics that allows spatially resolved XPS measurements in the submicron scale. Several recent examples of investigations of chemically modified or doped nanomaterials are given. The modification of suspended and supported graphene with nitrogen and fluorine is presented as well as the doping dependent position of the Fermi-level in single GsAs nanowires and the Mott–Hubbard transition in Cr-doped vanadium oxide. These examples show several peculiar SPEM abilities like a high surface and chemical sensitivity and a submicron spatial resolution proving the capability and importance of this technique to study materials at the nanoscale.</p>},
  articleno    = {1800308},
  author       = {Zeller, Patrick and Amati, Matteo and Sezen, Hikmet and Scardamaglia, Mattia and Struzzi, Claudia and Bittencourt, Carla and Lantz, Gabriel and Hajlaoui, Mahdi and Papalazarou, Evangelos and Marino, Marsi and Fanetti, Mattia and Ambrosini, Stefano and Rubini, Silvia and Gregoratti, Luca},
  issn         = {1862-6300},
  keyword      = {graphene,Mott–Hubbard transition,scanning photoemission microscopy,semiconductor nanowires,X-ray photoelectron spectroscopy},
  language     = {eng},
  month        = {08},
  number       = {19},
  publisher    = {Wiley-Blackwell},
  series       = {Physica Status Solidi (A) Applications and Materials Science},
  title        = {Scanning Photoelectron Spectro-Microscopy : A Modern Tool for the Study of Materials at the Nanoscale},
  url          = {http://dx.doi.org/10.1002/pssa.201800308},
  volume       = {215},
  year         = {2018},
}