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Near ambient pressure photoelectron spectro-microscopy : From gas-solid interface to operando devices

Amati, Matteo ; Gregoratti, Luca ; Zeller, Patrick ; Greiner, Mark ; Scardamaglia, Mattia LU ; Junker, Benjamin ; Ruß, Tamara ; Weimar, Udo ; Barsan, Nicolae and Favaro, Marco , et al. (2021) In Journal of Physics D: Applied Physics 54(20).
Abstract

Near ambient pressure scanning photoelectron microscopy adds to the widely used photoemission spectroscopy and its chemically selective capability two key features: (1) the possibility to chemically analyse samples in a more realistic gas pressure condition and (2) the capability to investigate a system at the relevant spatial scale. To achieve these goals the approach developed at the ESCA Microscopy beamline at the Elettra Synchrotron facility combines the submicron lateral resolution of a Scanning Photoelectron Microscope with a custom designed Near Ambient Pressure Cell where a gas pressure up to 0.1 mbar can be achieved. In this manuscript a review of experiments performed with this unique setup will be presented to illustrate its... (More)

Near ambient pressure scanning photoelectron microscopy adds to the widely used photoemission spectroscopy and its chemically selective capability two key features: (1) the possibility to chemically analyse samples in a more realistic gas pressure condition and (2) the capability to investigate a system at the relevant spatial scale. To achieve these goals the approach developed at the ESCA Microscopy beamline at the Elettra Synchrotron facility combines the submicron lateral resolution of a Scanning Photoelectron Microscope with a custom designed Near Ambient Pressure Cell where a gas pressure up to 0.1 mbar can be achieved. In this manuscript a review of experiments performed with this unique setup will be presented to illustrate its potentiality in both fundamental and applicative research such as the oxidation reactivity and gas sensitivity of metal oxides and semiconductors. In particular, the capability to perform operando experiments with this setup opens the possibility to study operating devices and to properly address the real nature of the studied systems, because if microscopy and spectroscopy are simultaneously combined in a single technique it can yield to more conclusive results.

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organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
2D materials, gas-solid interfaces, near ambient pressure XPS, oxidation, photoelectron spectromicroscopy, photoemission, SPEM
in
Journal of Physics D: Applied Physics
volume
54
issue
20
article number
204004
publisher
IOP Publishing
external identifiers
  • scopus:85103112376
ISSN
0022-3727
DOI
10.1088/1361-6463/abe5e2
language
English
LU publication?
yes
id
3cc1aad5-9c99-4699-90b5-f13f96bb1463
date added to LUP
2021-04-07 07:02:39
date last changed
2022-04-27 01:15:00
@article{3cc1aad5-9c99-4699-90b5-f13f96bb1463,
  abstract     = {{<p>Near ambient pressure scanning photoelectron microscopy adds to the widely used photoemission spectroscopy and its chemically selective capability two key features: (1) the possibility to chemically analyse samples in a more realistic gas pressure condition and (2) the capability to investigate a system at the relevant spatial scale. To achieve these goals the approach developed at the ESCA Microscopy beamline at the Elettra Synchrotron facility combines the submicron lateral resolution of a Scanning Photoelectron Microscope with a custom designed Near Ambient Pressure Cell where a gas pressure up to 0.1 mbar can be achieved. In this manuscript a review of experiments performed with this unique setup will be presented to illustrate its potentiality in both fundamental and applicative research such as the oxidation reactivity and gas sensitivity of metal oxides and semiconductors. In particular, the capability to perform operando experiments with this setup opens the possibility to study operating devices and to properly address the real nature of the studied systems, because if microscopy and spectroscopy are simultaneously combined in a single technique it can yield to more conclusive results.</p>}},
  author       = {{Amati, Matteo and Gregoratti, Luca and Zeller, Patrick and Greiner, Mark and Scardamaglia, Mattia and Junker, Benjamin and Ruß, Tamara and Weimar, Udo and Barsan, Nicolae and Favaro, Marco and Alharbi, Abdulaziz and Jensen, Ingvild J.T. and Ali, Ayaz and Belle, Branson D.}},
  issn         = {{0022-3727}},
  keywords     = {{2D materials; gas-solid interfaces; near ambient pressure XPS; oxidation; photoelectron spectromicroscopy; photoemission; SPEM}},
  language     = {{eng}},
  number       = {{20}},
  publisher    = {{IOP Publishing}},
  series       = {{Journal of Physics D: Applied Physics}},
  title        = {{Near ambient pressure photoelectron spectro-microscopy : From gas-solid interface to operando devices}},
  url          = {{http://dx.doi.org/10.1088/1361-6463/abe5e2}},
  doi          = {{10.1088/1361-6463/abe5e2}},
  volume       = {{54}},
  year         = {{2021}},
}