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Limitations of the pulse-shape technique for particle discrimination in planar Si detectors

Pausch, G; Moszynski, M; Bohne, W; Cederkäll, Joakim LU ; Grawe, H; Klamra, W; Lampert, MO; Rohr, P; Schubart, R and Seidel, W, et al. (1997) In IEEE Transactions on Nuclear Science 44(3). p.1040-1045
Abstract
Limitations of the pulse-shape discrimination (PSD) technique - a promising method to identify the charged particles stopped in planar Si-detectors - have been investigated. The particle resolution turned out to be basically determined by resistivity fluctuations in the bulk silicon which cause the charge-collection time to depend on the point of impact. Detector maps showing these fluctuations have been measured and are discussed. Furthermore we present a simple method to test the performance of detectors with respect to PSD. Another limitation of the PSD technique is the finite energy threshold for particle identification. This threshold is caused by an unexpected decrease of the total charge-collection time for ions with a short range,... (More)
Limitations of the pulse-shape discrimination (PSD) technique - a promising method to identify the charged particles stopped in planar Si-detectors - have been investigated. The particle resolution turned out to be basically determined by resistivity fluctuations in the bulk silicon which cause the charge-collection time to depend on the point of impact. Detector maps showing these fluctuations have been measured and are discussed. Furthermore we present a simple method to test the performance of detectors with respect to PSD. Another limitation of the PSD technique is the finite energy threshold for particle identification. This threshold is caused by an unexpected decrease of the total charge-collection time for ions with a short range, in spite of the fact that the particle tracks are located in a region of very low electric field. (Less)
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publication status
published
subject
in
IEEE Transactions on Nuclear Science
volume
44
issue
3
pages
1040 - 1045
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
external identifiers
  • wos:A1997XF30200146
  • scopus:0006098995
ISSN
0018-9499
DOI
10.1109/23.603801
language
English
LU publication?
no
id
419abf13-8668-4a02-888d-3351667f453b (old id 4282547)
date added to LUP
2014-02-03 10:17:59
date last changed
2017-01-01 06:47:58
@article{419abf13-8668-4a02-888d-3351667f453b,
  abstract     = {Limitations of the pulse-shape discrimination (PSD) technique - a promising method to identify the charged particles stopped in planar Si-detectors - have been investigated. The particle resolution turned out to be basically determined by resistivity fluctuations in the bulk silicon which cause the charge-collection time to depend on the point of impact. Detector maps showing these fluctuations have been measured and are discussed. Furthermore we present a simple method to test the performance of detectors with respect to PSD. Another limitation of the PSD technique is the finite energy threshold for particle identification. This threshold is caused by an unexpected decrease of the total charge-collection time for ions with a short range, in spite of the fact that the particle tracks are located in a region of very low electric field.},
  author       = {Pausch, G and Moszynski, M and Bohne, W and Cederkäll, Joakim and Grawe, H and Klamra, W and Lampert, MO and Rohr, P and Schubart, R and Seidel, W and Wolski, D},
  issn         = {0018-9499},
  language     = {eng},
  number       = {3},
  pages        = {1040--1045},
  publisher    = {IEEE--Institute of Electrical and Electronics Engineers Inc.},
  series       = {IEEE Transactions on Nuclear Science},
  title        = {Limitations of the pulse-shape technique for particle discrimination in planar Si detectors},
  url          = {http://dx.doi.org/10.1109/23.603801},
  volume       = {44},
  year         = {1997},
}