Advanced

Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials

Suga, Mitsuo; Asahina, Shunsuke; Sakuda, Yusuke; Kazumori, Hiroyoshi; Nishiyama, Hidetoshi; Nokuo, Takeshi; Alfredsson, Viveka LU ; Kjellman, Tomas LU ; Stevens, Sam M. and Cho, Hae Sung, et al. (2014) In Progress in Solid State Chemistry 42(1-2). p.1-21
Abstract
Research concerning nano-materials (metal-organic frameworks (MOFs), zeolites, mesoporous silicas, etc.) and the nano-scale, including potential barriers for the particulates to diffusion to/from is of increasing importance to the understanding of the catalytic utility of porous materials when combined with any potential super structures (such as hierarchically porous materials). However, it is difficult to characterize the structure of for example MOFs via X-ray powder diffraction because of the serious overlapping of re- flections caused by their large unit cells, and it is also difficult to directly observe the opening of surface pores using ordinary methods. Electron-microscopic methods including high-resolution scanning electron... (More)
Research concerning nano-materials (metal-organic frameworks (MOFs), zeolites, mesoporous silicas, etc.) and the nano-scale, including potential barriers for the particulates to diffusion to/from is of increasing importance to the understanding of the catalytic utility of porous materials when combined with any potential super structures (such as hierarchically porous materials). However, it is difficult to characterize the structure of for example MOFs via X-ray powder diffraction because of the serious overlapping of re- flections caused by their large unit cells, and it is also difficult to directly observe the opening of surface pores using ordinary methods. Electron-microscopic methods including high-resolution scanning electron microscopy (HRSEM) have therefore become imperative for the above challenges. Here, we present the theory and practical application of recent advances such as through-the-lens detection systems, which permit a reduced landing energy and the selection of high-resolution, topographically specific emitted electrons, even from electrically insulating nano-materials. (Less)
Please use this url to cite or link to this publication:
author
, et al. (More)
(Less)
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Scanning electron microscopy, Through-the-lens detection system, Nano-materials, Atmospheric SEM, Metal-organic frameworks, Mesoporous, materials
in
Progress in Solid State Chemistry
volume
42
issue
1-2
pages
1 - 21
publisher
Elsevier
external identifiers
  • wos:000335705400001
  • scopus:84898043548
ISSN
1873-1643
DOI
10.1016/j.progsolidstchem.2014.02.001
language
English
LU publication?
yes
id
9b2fb070-aafe-4dca-a747-617f4bcd485c (old id 4473504)
date added to LUP
2014-06-19 13:20:50
date last changed
2017-08-27 03:13:02
@article{9b2fb070-aafe-4dca-a747-617f4bcd485c,
  abstract     = {Research concerning nano-materials (metal-organic frameworks (MOFs), zeolites, mesoporous silicas, etc.) and the nano-scale, including potential barriers for the particulates to diffusion to/from is of increasing importance to the understanding of the catalytic utility of porous materials when combined with any potential super structures (such as hierarchically porous materials). However, it is difficult to characterize the structure of for example MOFs via X-ray powder diffraction because of the serious overlapping of re- flections caused by their large unit cells, and it is also difficult to directly observe the opening of surface pores using ordinary methods. Electron-microscopic methods including high-resolution scanning electron microscopy (HRSEM) have therefore become imperative for the above challenges. Here, we present the theory and practical application of recent advances such as through-the-lens detection systems, which permit a reduced landing energy and the selection of high-resolution, topographically specific emitted electrons, even from electrically insulating nano-materials.},
  author       = {Suga, Mitsuo and Asahina, Shunsuke and Sakuda, Yusuke and Kazumori, Hiroyoshi and Nishiyama, Hidetoshi and Nokuo, Takeshi and Alfredsson, Viveka and Kjellman, Tomas and Stevens, Sam M. and Cho, Hae Sung and Cho, Minhyung and Han, Lu and Che, Shunai and Anderson, Michael W. and Schueth, Ferdi and Deng, Hexiang and Yaghi, Omar M. and Liu, Zheng and Jeong, Hu Young and Stein, Andreas and Sakamoto, Kazuyuki and Ryoo, Ryong and Terasaki, Osamu},
  issn         = {1873-1643},
  keyword      = {Scanning electron microscopy,Through-the-lens detection system,Nano-materials,Atmospheric SEM,Metal-organic frameworks,Mesoporous,materials},
  language     = {eng},
  number       = {1-2},
  pages        = {1--21},
  publisher    = {Elsevier},
  series       = {Progress in Solid State Chemistry},
  title        = {Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials},
  url          = {http://dx.doi.org/10.1016/j.progsolidstchem.2014.02.001},
  volume       = {42},
  year         = {2014},
}