Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials
(2014) In Progress in Solid State Chemistry 42(1-2). p.1-21- Abstract
- Research concerning nano-materials (metal-organic frameworks (MOFs), zeolites, mesoporous silicas, etc.) and the nano-scale, including potential barriers for the particulates to diffusion to/from is of increasing importance to the understanding of the catalytic utility of porous materials when combined with any potential super structures (such as hierarchically porous materials). However, it is difficult to characterize the structure of for example MOFs via X-ray powder diffraction because of the serious overlapping of re- flections caused by their large unit cells, and it is also difficult to directly observe the opening of surface pores using ordinary methods. Electron-microscopic methods including high-resolution scanning electron... (More)
- Research concerning nano-materials (metal-organic frameworks (MOFs), zeolites, mesoporous silicas, etc.) and the nano-scale, including potential barriers for the particulates to diffusion to/from is of increasing importance to the understanding of the catalytic utility of porous materials when combined with any potential super structures (such as hierarchically porous materials). However, it is difficult to characterize the structure of for example MOFs via X-ray powder diffraction because of the serious overlapping of re- flections caused by their large unit cells, and it is also difficult to directly observe the opening of surface pores using ordinary methods. Electron-microscopic methods including high-resolution scanning electron microscopy (HRSEM) have therefore become imperative for the above challenges. Here, we present the theory and practical application of recent advances such as through-the-lens detection systems, which permit a reduced landing energy and the selection of high-resolution, topographically specific emitted electrons, even from electrically insulating nano-materials. (Less)
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https://lup.lub.lu.se/record/4473504
- author
- organization
- publishing date
- 2014
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- Scanning electron microscopy, Through-the-lens detection system, Nano-materials, Atmospheric SEM, Metal-organic frameworks, Mesoporous, materials
- in
- Progress in Solid State Chemistry
- volume
- 42
- issue
- 1-2
- pages
- 1 - 21
- publisher
- Elsevier
- external identifiers
-
- wos:000335705400001
- scopus:84898043548
- ISSN
- 1873-1643
- DOI
- 10.1016/j.progsolidstchem.2014.02.001
- language
- English
- LU publication?
- yes
- id
- 9b2fb070-aafe-4dca-a747-617f4bcd485c (old id 4473504)
- date added to LUP
- 2016-04-01 10:07:53
- date last changed
- 2023-11-09 12:33:10
@article{9b2fb070-aafe-4dca-a747-617f4bcd485c, abstract = {{Research concerning nano-materials (metal-organic frameworks (MOFs), zeolites, mesoporous silicas, etc.) and the nano-scale, including potential barriers for the particulates to diffusion to/from is of increasing importance to the understanding of the catalytic utility of porous materials when combined with any potential super structures (such as hierarchically porous materials). However, it is difficult to characterize the structure of for example MOFs via X-ray powder diffraction because of the serious overlapping of re- flections caused by their large unit cells, and it is also difficult to directly observe the opening of surface pores using ordinary methods. Electron-microscopic methods including high-resolution scanning electron microscopy (HRSEM) have therefore become imperative for the above challenges. Here, we present the theory and practical application of recent advances such as through-the-lens detection systems, which permit a reduced landing energy and the selection of high-resolution, topographically specific emitted electrons, even from electrically insulating nano-materials.}}, author = {{Suga, Mitsuo and Asahina, Shunsuke and Sakuda, Yusuke and Kazumori, Hiroyoshi and Nishiyama, Hidetoshi and Nokuo, Takeshi and Alfredsson, Viveka and Kjellman, Tomas and Stevens, Sam M. and Cho, Hae Sung and Cho, Minhyung and Han, Lu and Che, Shunai and Anderson, Michael W. and Schueth, Ferdi and Deng, Hexiang and Yaghi, Omar M. and Liu, Zheng and Jeong, Hu Young and Stein, Andreas and Sakamoto, Kazuyuki and Ryoo, Ryong and Terasaki, Osamu}}, issn = {{1873-1643}}, keywords = {{Scanning electron microscopy; Through-the-lens detection system; Nano-materials; Atmospheric SEM; Metal-organic frameworks; Mesoporous; materials}}, language = {{eng}}, number = {{1-2}}, pages = {{1--21}}, publisher = {{Elsevier}}, series = {{Progress in Solid State Chemistry}}, title = {{Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials}}, url = {{http://dx.doi.org/10.1016/j.progsolidstchem.2014.02.001}}, doi = {{10.1016/j.progsolidstchem.2014.02.001}}, volume = {{42}}, year = {{2014}}, }