Advanced

Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules

Vinay, N.S.; Rawat, Indira; Gaur, M.S.; Larsson, Erik LU and Singh, Virendra (2010) IEEE East-West Design and Test Symposium (EWDTS10)
Please use this url to cite or link to this publication:
author
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Design & Test Symposium (EWDTS), 2010 East-West
conference name
IEEE East-West Design and Test Symposium (EWDTS10)
conference location
St. Petersburg, Russian Federation
conference dates
2010-09-17 - 2010-09-20
external identifiers
  • scopus:79955954690
ISBN
978-1-4244-9555-9
DOI
10.1109/EWDTS.2010.5742053
language
English
LU publication?
no
id
4d055bb4-89c5-4133-80b8-b5b30377249b (old id 2340884)
date added to LUP
2012-02-10 13:51:06
date last changed
2019-02-20 09:46:43
@inproceedings{4d055bb4-89c5-4133-80b8-b5b30377249b,
  author       = {Vinay, N.S. and Rawat, Indira and Gaur, M.S. and Larsson, Erik and Singh, Virendra},
  isbn         = {978-1-4244-9555-9},
  language     = {eng},
  location     = {St. Petersburg, Russian Federation},
  title        = {Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules},
  url          = {http://dx.doi.org/10.1109/EWDTS.2010.5742053},
  year         = {2010},
}