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Direct Observation of Plugs and Intrawall Pores in SBA-15 Using Low Voltage High Resolution Scanning Electron Microscopy and the Influence of Solvent Properties on Plug-Formation

Kjellman, Tomas LU ; Asahina, Shunsuke ; Schmitt, Julien ; Imperor-Clerc, Marianne ; Terasaki, Osamu and Alfredsson, Viveka LU (2013) In Chemistry of Materials 25(20). p.4105-4112
Abstract
Through the use of low voltage high resolution scanning electron microscopy (LV-HRSEM) we have studied the fine details of the intricate pore structure of SBA-15. Intrawall pores and deviations from the ideal and uniform cylindrical pores are clearly observed, and we report for the first time the direct observation of "plugs" in the pores. N-2-sorption measurements confirm their existence. LV-HRSEM provides an opportunity to quantify the frequency of occurrence of plugs within the pore structure. The rate of mesophase formation, followed with in situ small angle X-ray scattering (SAXS) under different solvent conditions, is shown to have a significant influence on the development of plugs and how frequently they occur. We suggest a... (More)
Through the use of low voltage high resolution scanning electron microscopy (LV-HRSEM) we have studied the fine details of the intricate pore structure of SBA-15. Intrawall pores and deviations from the ideal and uniform cylindrical pores are clearly observed, and we report for the first time the direct observation of "plugs" in the pores. N-2-sorption measurements confirm their existence. LV-HRSEM provides an opportunity to quantify the frequency of occurrence of plugs within the pore structure. The rate of mesophase formation, followed with in situ small angle X-ray scattering (SAXS) under different solvent conditions, is shown to have a significant influence on the development of plugs and how frequently they occur. We suggest a mechanism explaining the existence of the plugs, providing means for a better understanding and control over material properties. (Less)
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author
; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
SBA-15, plugs, LV-HRSEM, intrawall pores, pore structure, in situ SAXS, N-2-sorption
in
Chemistry of Materials
volume
25
issue
20
pages
4105 - 4112
publisher
The American Chemical Society (ACS)
external identifiers
  • wos:000326209200021
  • scopus:84886653102
ISSN
0897-4756
DOI
10.1021/cm402635m
language
English
LU publication?
yes
id
4e2395ef-f5a0-42c8-a39a-79af8642cffa (old id 4212755)
date added to LUP
2016-04-01 10:05:35
date last changed
2023-09-27 17:12:24
@article{4e2395ef-f5a0-42c8-a39a-79af8642cffa,
  abstract     = {{Through the use of low voltage high resolution scanning electron microscopy (LV-HRSEM) we have studied the fine details of the intricate pore structure of SBA-15. Intrawall pores and deviations from the ideal and uniform cylindrical pores are clearly observed, and we report for the first time the direct observation of "plugs" in the pores. N-2-sorption measurements confirm their existence. LV-HRSEM provides an opportunity to quantify the frequency of occurrence of plugs within the pore structure. The rate of mesophase formation, followed with in situ small angle X-ray scattering (SAXS) under different solvent conditions, is shown to have a significant influence on the development of plugs and how frequently they occur. We suggest a mechanism explaining the existence of the plugs, providing means for a better understanding and control over material properties.}},
  author       = {{Kjellman, Tomas and Asahina, Shunsuke and Schmitt, Julien and Imperor-Clerc, Marianne and Terasaki, Osamu and Alfredsson, Viveka}},
  issn         = {{0897-4756}},
  keywords     = {{SBA-15; plugs; LV-HRSEM; intrawall pores; pore structure; in situ SAXS; N-2-sorption}},
  language     = {{eng}},
  number       = {{20}},
  pages        = {{4105--4112}},
  publisher    = {{The American Chemical Society (ACS)}},
  series       = {{Chemistry of Materials}},
  title        = {{Direct Observation of Plugs and Intrawall Pores in SBA-15 Using Low Voltage High Resolution Scanning Electron Microscopy and the Influence of Solvent Properties on Plug-Formation}},
  url          = {{http://dx.doi.org/10.1021/cm402635m}},
  doi          = {{10.1021/cm402635m}},
  volume       = {{25}},
  year         = {{2013}},
}