Disentangling detector data in XFEL studies of temporally resolved solution state chemistry
(2015) In Faraday Discussions 177. p.443-465- Abstract
- With the arrival of X-ray Free Electron Lasers (XFELs), 2D area detectors with a large dynamic range for detection of hard X-rays with fast readout rates are required for many types of experiments. Extracting the desired information from these detectors has been challenging due to unpredicted fluctuations in the measured images. For techniques such as time-resolved X-ray Diffuse Scattering (XDS), small differences in signal intensity are the starting point for analysis. Fluctuations in the total detected signal remain in the differences under investigation, obfuscating the signal. To correct such artefacts, Singular Value Decomposition (SVD) can be used to identify and characterize the observed detector fluctuations and assist in assigning... (More)
- With the arrival of X-ray Free Electron Lasers (XFELs), 2D area detectors with a large dynamic range for detection of hard X-rays with fast readout rates are required for many types of experiments. Extracting the desired information from these detectors has been challenging due to unpredicted fluctuations in the measured images. For techniques such as time-resolved X-ray Diffuse Scattering (XDS), small differences in signal intensity are the starting point for analysis. Fluctuations in the total detected signal remain in the differences under investigation, obfuscating the signal. To correct such artefacts, Singular Value Decomposition (SVD) can be used to identify and characterize the observed detector fluctuations and assist in assigning some of them to variations in physical parameters such as X-ray energy and X-ray intensity. This paper presents a methodology for robustly identifying, separating and correcting fluctuations on area detectors based on XFEL beam characteristics, to enable the study of temporally resolved solution state chemistry on the femtosecond timescale. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/5401172
- author
- van Driel, Tim Brandt ; Kjaer, Kasper LU ; Biasin, Elisa ; Haldrup, Kristoffer ; Lemke, Henrik Till and Nielsen, Martin Meedom
- organization
- publishing date
- 2015
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Faraday Discussions
- volume
- 177
- pages
- 443 - 465
- publisher
- Royal Society of Chemistry
- external identifiers
-
- wos:000353034300026
- scopus:84928141210
- pmid:25675434
- ISSN
- 1364-5498
- DOI
- 10.1039/c4fd00203b
- language
- English
- LU publication?
- yes
- additional info
- The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Chemical Physics (S) (011001060)
- id
- a902eae8-03fc-48fd-8527-a4e8305e4dcc (old id 5401172)
- date added to LUP
- 2016-04-01 09:54:39
- date last changed
- 2022-04-19 20:41:38
@article{a902eae8-03fc-48fd-8527-a4e8305e4dcc, abstract = {{With the arrival of X-ray Free Electron Lasers (XFELs), 2D area detectors with a large dynamic range for detection of hard X-rays with fast readout rates are required for many types of experiments. Extracting the desired information from these detectors has been challenging due to unpredicted fluctuations in the measured images. For techniques such as time-resolved X-ray Diffuse Scattering (XDS), small differences in signal intensity are the starting point for analysis. Fluctuations in the total detected signal remain in the differences under investigation, obfuscating the signal. To correct such artefacts, Singular Value Decomposition (SVD) can be used to identify and characterize the observed detector fluctuations and assist in assigning some of them to variations in physical parameters such as X-ray energy and X-ray intensity. This paper presents a methodology for robustly identifying, separating and correcting fluctuations on area detectors based on XFEL beam characteristics, to enable the study of temporally resolved solution state chemistry on the femtosecond timescale.}}, author = {{van Driel, Tim Brandt and Kjaer, Kasper and Biasin, Elisa and Haldrup, Kristoffer and Lemke, Henrik Till and Nielsen, Martin Meedom}}, issn = {{1364-5498}}, language = {{eng}}, pages = {{443--465}}, publisher = {{Royal Society of Chemistry}}, series = {{Faraday Discussions}}, title = {{Disentangling detector data in XFEL studies of temporally resolved solution state chemistry}}, url = {{http://dx.doi.org/10.1039/c4fd00203b}}, doi = {{10.1039/c4fd00203b}}, volume = {{177}}, year = {{2015}}, }