OVERVIEW, PRACTICAL TIPS AND POTENTIAL PITFALLS USING AUTOMATIC EXPOSURE CONTROL IN CT – SIEMENS CARE DOSE 4D
(2015) Optimisation in X-ray and Molecular Imaging
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/5466050
- author
- Söderberg, Marcus LU
- organization
- publishing date
- 2015
- type
- Contribution to conference
- publication status
- published
- subject
- conference name
- Optimisation in X-ray and Molecular Imaging
- conference location
- Gothenburg, Sweden
- conference dates
- 2015-05-28 - 2015-05-30
- language
- English
- LU publication?
- yes
- id
- 21b1bb7b-c922-495d-8d87-9a1f556fd345 (old id 5466050)
- alternative location
- http://www.delegia.com/app/attendee/default.asp?PageId=33051&MenuItemId=28780&ProjectId=5200
- http://www.delegia.com/app/Data/ProjectImages/5200/Abstract_book_final_post.pdf
- date added to LUP
- 2016-04-04 14:01:31
- date last changed
- 2018-11-21 21:17:48
@misc{21b1bb7b-c922-495d-8d87-9a1f556fd345, author = {{Söderberg, Marcus}}, language = {{eng}}, title = {{OVERVIEW, PRACTICAL TIPS AND POTENTIAL PITFALLS USING AUTOMATIC EXPOSURE CONTROL IN CT – SIEMENS CARE DOSE 4D}}, url = {{http://www.delegia.com/app/attendee/default.asp?PageId=33051&MenuItemId=28780&ProjectId=5200}}, year = {{2015}}, }