Direct observation of the tip shape in scanning probe microscopy
(1993) In Applied Physics Letters 62(21). p.2628-2630- Abstract
In this study we report on the first direct observation of the real shape of the atomic force microscopy (AFM) tip using the AFM technique itself, utilizing a specially designed sample geometry. This is the first report of the so-called inverse AFM mode in which the tip is actually used as the sample and vice versa. We propose how this method can, with a very high accuracy, be used for studying objects, e.g., biomolecules, that are attached to the usual AFM cantilever tip. Finally, we discuss how this method can significantly increase the reliability of the obtained AFM images.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/5d6ba918-a9e3-4994-92ed-433f1d84d53a
- author
- Montelius, L. LU and Tegenfeldt, J. O. LU
- organization
- publishing date
- 1993-12-01
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Applied Physics Letters
- volume
- 62
- issue
- 21
- pages
- 3 pages
- publisher
- American Institute of Physics (AIP)
- external identifiers
-
- scopus:21544453647
- ISSN
- 0003-6951
- DOI
- 10.1063/1.109267
- language
- English
- LU publication?
- yes
- id
- 5d6ba918-a9e3-4994-92ed-433f1d84d53a
- date added to LUP
- 2018-10-20 10:59:00
- date last changed
- 2021-05-23 05:49:41
@article{5d6ba918-a9e3-4994-92ed-433f1d84d53a, abstract = {{<p>In this study we report on the first direct observation of the real shape of the atomic force microscopy (AFM) tip using the AFM technique itself, utilizing a specially designed sample geometry. This is the first report of the so-called inverse AFM mode in which the tip is actually used as the sample and vice versa. We propose how this method can, with a very high accuracy, be used for studying objects, e.g., biomolecules, that are attached to the usual AFM cantilever tip. Finally, we discuss how this method can significantly increase the reliability of the obtained AFM images.</p>}}, author = {{Montelius, L. and Tegenfeldt, J. O.}}, issn = {{0003-6951}}, language = {{eng}}, month = {{12}}, number = {{21}}, pages = {{2628--2630}}, publisher = {{American Institute of Physics (AIP)}}, series = {{Applied Physics Letters}}, title = {{Direct observation of the tip shape in scanning probe microscopy}}, url = {{http://dx.doi.org/10.1063/1.109267}}, doi = {{10.1063/1.109267}}, volume = {{62}}, year = {{1993}}, }