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Direct observation of the tip shape in scanning probe microscopy

Montelius, L. LU and Tegenfeldt, J. O. LU orcid (1993) In Applied Physics Letters 62(21). p.2628-2630
Abstract

In this study we report on the first direct observation of the real shape of the atomic force microscopy (AFM) tip using the AFM technique itself, utilizing a specially designed sample geometry. This is the first report of the so-called inverse AFM mode in which the tip is actually used as the sample and vice versa. We propose how this method can, with a very high accuracy, be used for studying objects, e.g., biomolecules, that are attached to the usual AFM cantilever tip. Finally, we discuss how this method can significantly increase the reliability of the obtained AFM images.

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author
and
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics Letters
volume
62
issue
21
pages
3 pages
publisher
American Institute of Physics (AIP)
external identifiers
  • scopus:21544453647
ISSN
0003-6951
DOI
10.1063/1.109267
language
English
LU publication?
yes
id
5d6ba918-a9e3-4994-92ed-433f1d84d53a
date added to LUP
2018-10-20 10:59:00
date last changed
2021-05-23 05:49:41
@article{5d6ba918-a9e3-4994-92ed-433f1d84d53a,
  abstract     = {{<p>In this study we report on the first direct observation of the real shape of the atomic force microscopy (AFM) tip using the AFM technique itself, utilizing a specially designed sample geometry. This is the first report of the so-called inverse AFM mode in which the tip is actually used as the sample and vice versa. We propose how this method can, with a very high accuracy, be used for studying objects, e.g., biomolecules, that are attached to the usual AFM cantilever tip. Finally, we discuss how this method can significantly increase the reliability of the obtained AFM images.</p>}},
  author       = {{Montelius, L. and Tegenfeldt, J. O.}},
  issn         = {{0003-6951}},
  language     = {{eng}},
  month        = {{12}},
  number       = {{21}},
  pages        = {{2628--2630}},
  publisher    = {{American Institute of Physics (AIP)}},
  series       = {{Applied Physics Letters}},
  title        = {{Direct observation of the tip shape in scanning probe microscopy}},
  url          = {{http://dx.doi.org/10.1063/1.109267}},
  doi          = {{10.1063/1.109267}},
  volume       = {{62}},
  year         = {{1993}},
}