On integrated test of embedded components
(2002) ProGress Workshop p.224-229- Abstract
- Embedded systems are a characteristic but intangible part of an embedding environment. This poses a severe testing problem that gets further aggravated in embedded networks. The co-presence of hardware and software needs both behavioral and structural aspects to be covered, preferably by a single on-chip paradigm. The paper investigates the potential role of neural networks and introduces a Built-In Functional Test concept to extend the BILBO technology to the behavioral level.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/603894
- author
- Spaanenburg, Lambert LU and Alberts, R
- publishing date
- 2002
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- Test Pattern Compaction, Built-in Test, FPGA, Design for Test, Time-delay ANN
- host publication
- Proceedings 3rd Progress Workshop
- pages
- 224 - 229
- publisher
- STW
- conference name
- ProGress Workshop
- conference location
- Netherlands
- conference dates
- 0001-01-02
- ISBN
- 90-73461-34-0
- language
- English
- LU publication?
- no
- id
- 8d5a0764-d292-4c9a-a460-4ab1a83baa56 (old id 603894)
- date added to LUP
- 2016-04-04 10:30:11
- date last changed
- 2018-11-21 20:59:08
@inproceedings{8d5a0764-d292-4c9a-a460-4ab1a83baa56, abstract = {{Embedded systems are a characteristic but intangible part of an embedding environment. This poses a severe testing problem that gets further aggravated in embedded networks. The co-presence of hardware and software needs both behavioral and structural aspects to be covered, preferably by a single on-chip paradigm. The paper investigates the potential role of neural networks and introduces a Built-In Functional Test concept to extend the BILBO technology to the behavioral level.}}, author = {{Spaanenburg, Lambert and Alberts, R}}, booktitle = {{Proceedings 3rd Progress Workshop}}, isbn = {{90-73461-34-0}}, keywords = {{Test Pattern Compaction; Built-in Test; FPGA; Design for Test; Time-delay ANN}}, language = {{eng}}, pages = {{224--229}}, publisher = {{STW}}, title = {{On integrated test of embedded components}}, year = {{2002}}, }