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Multifrequency Test and Diagnosis of Analog Circuits Using Constraint Programming and Interval Arithmetic

Fuentes, Ana LU and Kuchcinski, Krzysztof LU orcid (2003) IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2003
Abstract
Analog circuits are often specified using non-linear equations, which are difficult to analyze. Therefore, test generation and diagnosis are problematic issues in practice. In this paper we propose a new method for diagnosis of analog circuits that uses combined information from tests at different frequencies. By solving simultaneously the resulting equations (one for each test frequency), we get a reliable method that decreases the number of possible answers to the diagnosis

problem. The min-max optimization algorithm that we implemented for non-linear transfer functions gives good average runtime for diagnosis parametric

faults.
Please use this url to cite or link to this publication:
author
and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Proceedings of the IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
conference name
IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2003
conference location
Poznan, Poland
conference dates
2003-04-14 - 2003-04-16
language
English
LU publication?
yes
id
1b7e9188-6158-4024-a540-c6ef0f85f938 (old id 622129)
date added to LUP
2016-04-04 12:53:37
date last changed
2021-05-05 11:09:03
@inproceedings{1b7e9188-6158-4024-a540-c6ef0f85f938,
  abstract     = {Analog circuits are often specified using non-linear equations, which are difficult to analyze. Therefore, test generation and diagnosis are problematic issues in practice. In this paper we propose a new method for diagnosis of analog circuits that uses combined information from tests at different frequencies. By solving simultaneously the resulting equations (one for each test frequency), we get a reliable method that decreases the number of possible answers to the diagnosis<br/><br>
problem. The min-max optimization algorithm that we implemented for non-linear transfer functions gives good average runtime for diagnosis parametric<br/><br>
faults.},
  author       = {Fuentes, Ana and Kuchcinski, Krzysztof},
  booktitle    = {Proceedings of the IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems},
  language     = {eng},
  title        = {Multifrequency Test and Diagnosis of Analog Circuits Using Constraint Programming and Interval Arithmetic},
  year         = {2003},
}