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Scanning photoelectron spectromicroscopy : From static to operando studies of functional materials

Amati, M. ; Susi, Toma ; Jovičević-Klug, P. ; Jovičević-Klug, M. ; Kosmala, Tomasz ; Granozzi, Gaetano ; Agnoli, Stefano ; Yang, Pengfei ; Zhang, Yanfeng and Scardamaglia, Mattia LU , et al. (2023) In Journal of Electron Spectroscopy and Related Phenomena 265.
Abstract

The scanning photoelectron microscope (SPEM), developed more than 30 years ago, has undergone numerous technical developments, providing an incredibly vast kind of feasible sample environments, which span from the traditional high spatial resolution core level based chemical analysis to insitu and operando complex experiments, including also electrochemical setups and operational electronic devices at various temperatures. Another important step ahead is overcoming the so-called pressure gap for operando studies, recently extended to near ambient values by building special environmental cells. Using recent results of conventional and unconventional experiments, obtained with SPEM at the ESCA Microscopy beamline at Elettra Sincrotrone... (More)

The scanning photoelectron microscope (SPEM), developed more than 30 years ago, has undergone numerous technical developments, providing an incredibly vast kind of feasible sample environments, which span from the traditional high spatial resolution core level based chemical analysis to insitu and operando complex experiments, including also electrochemical setups and operational electronic devices at various temperatures. Another important step ahead is overcoming the so-called pressure gap for operando studies, recently extended to near ambient values by building special environmental cells. Using recent results of conventional and unconventional experiments, obtained with SPEM at the ESCA Microscopy beamline at Elettra Sincrotrone Trieste the present review demonstrates the current potential of this type of photoelectron spectromicroscopy to explore the interfacial properties of functional materials with high spatial resolution.

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publishing date
type
Contribution to journal
publication status
published
subject
keywords
Deep cryogenic treatment, Graphene, Scanning photoelectron spectromicroscopy, Surface science, Transition metal chalcogenides
in
Journal of Electron Spectroscopy and Related Phenomena
volume
265
article number
147336
publisher
Elsevier
external identifiers
  • scopus:85162924227
ISSN
0368-2048
DOI
10.1016/j.elspec.2023.147336
language
English
LU publication?
yes
id
63104f67-cdd7-461d-8575-aa105582b55f
date added to LUP
2023-09-20 14:40:33
date last changed
2023-09-20 14:40:33
@article{63104f67-cdd7-461d-8575-aa105582b55f,
  abstract     = {{<p>The scanning photoelectron microscope (SPEM), developed more than 30 years ago, has undergone numerous technical developments, providing an incredibly vast kind of feasible sample environments, which span from the traditional high spatial resolution core level based chemical analysis to insitu and operando complex experiments, including also electrochemical setups and operational electronic devices at various temperatures. Another important step ahead is overcoming the so-called pressure gap for operando studies, recently extended to near ambient values by building special environmental cells. Using recent results of conventional and unconventional experiments, obtained with SPEM at the ESCA Microscopy beamline at Elettra Sincrotrone Trieste the present review demonstrates the current potential of this type of photoelectron spectromicroscopy to explore the interfacial properties of functional materials with high spatial resolution.</p>}},
  author       = {{Amati, M. and Susi, Toma and Jovičević-Klug, P. and Jovičević-Klug, M. and Kosmala, Tomasz and Granozzi, Gaetano and Agnoli, Stefano and Yang, Pengfei and Zhang, Yanfeng and Scardamaglia, Mattia and Gregoratti, L.}},
  issn         = {{0368-2048}},
  keywords     = {{Deep cryogenic treatment; Graphene; Scanning photoelectron spectromicroscopy; Surface science; Transition metal chalcogenides}},
  language     = {{eng}},
  publisher    = {{Elsevier}},
  series       = {{Journal of Electron Spectroscopy and Related Phenomena}},
  title        = {{Scanning photoelectron spectromicroscopy : From static to operando studies of functional materials}},
  url          = {{http://dx.doi.org/10.1016/j.elspec.2023.147336}},
  doi          = {{10.1016/j.elspec.2023.147336}},
  volume       = {{265}},
  year         = {{2023}},
}