Scanning photoelectron spectromicroscopy : From static to operando studies of functional materials
(2023) In Journal of Electron Spectroscopy and Related Phenomena 265.- Abstract
The scanning photoelectron microscope (SPEM), developed more than 30 years ago, has undergone numerous technical developments, providing an incredibly vast kind of feasible sample environments, which span from the traditional high spatial resolution core level based chemical analysis to insitu and operando complex experiments, including also electrochemical setups and operational electronic devices at various temperatures. Another important step ahead is overcoming the so-called pressure gap for operando studies, recently extended to near ambient values by building special environmental cells. Using recent results of conventional and unconventional experiments, obtained with SPEM at the ESCA Microscopy beamline at Elettra Sincrotrone... (More)
The scanning photoelectron microscope (SPEM), developed more than 30 years ago, has undergone numerous technical developments, providing an incredibly vast kind of feasible sample environments, which span from the traditional high spatial resolution core level based chemical analysis to insitu and operando complex experiments, including also electrochemical setups and operational electronic devices at various temperatures. Another important step ahead is overcoming the so-called pressure gap for operando studies, recently extended to near ambient values by building special environmental cells. Using recent results of conventional and unconventional experiments, obtained with SPEM at the ESCA Microscopy beamline at Elettra Sincrotrone Trieste the present review demonstrates the current potential of this type of photoelectron spectromicroscopy to explore the interfacial properties of functional materials with high spatial resolution.
(Less)
- author
- organization
- publishing date
- 2023-05
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- Deep cryogenic treatment, Graphene, Scanning photoelectron spectromicroscopy, Surface science, Transition metal chalcogenides
- in
- Journal of Electron Spectroscopy and Related Phenomena
- volume
- 265
- article number
- 147336
- publisher
- Elsevier
- external identifiers
-
- scopus:85162924227
- ISSN
- 0368-2048
- DOI
- 10.1016/j.elspec.2023.147336
- language
- English
- LU publication?
- yes
- id
- 63104f67-cdd7-461d-8575-aa105582b55f
- date added to LUP
- 2023-09-20 14:40:33
- date last changed
- 2023-09-20 14:40:33
@article{63104f67-cdd7-461d-8575-aa105582b55f, abstract = {{<p>The scanning photoelectron microscope (SPEM), developed more than 30 years ago, has undergone numerous technical developments, providing an incredibly vast kind of feasible sample environments, which span from the traditional high spatial resolution core level based chemical analysis to insitu and operando complex experiments, including also electrochemical setups and operational electronic devices at various temperatures. Another important step ahead is overcoming the so-called pressure gap for operando studies, recently extended to near ambient values by building special environmental cells. Using recent results of conventional and unconventional experiments, obtained with SPEM at the ESCA Microscopy beamline at Elettra Sincrotrone Trieste the present review demonstrates the current potential of this type of photoelectron spectromicroscopy to explore the interfacial properties of functional materials with high spatial resolution.</p>}}, author = {{Amati, M. and Susi, Toma and Jovičević-Klug, P. and Jovičević-Klug, M. and Kosmala, Tomasz and Granozzi, Gaetano and Agnoli, Stefano and Yang, Pengfei and Zhang, Yanfeng and Scardamaglia, Mattia and Gregoratti, L.}}, issn = {{0368-2048}}, keywords = {{Deep cryogenic treatment; Graphene; Scanning photoelectron spectromicroscopy; Surface science; Transition metal chalcogenides}}, language = {{eng}}, publisher = {{Elsevier}}, series = {{Journal of Electron Spectroscopy and Related Phenomena}}, title = {{Scanning photoelectron spectromicroscopy : From static to operando studies of functional materials}}, url = {{http://dx.doi.org/10.1016/j.elspec.2023.147336}}, doi = {{10.1016/j.elspec.2023.147336}}, volume = {{265}}, year = {{2023}}, }