Effect of phase composition on X-ray absorption spectra of ZrO2 thin films
(2007) In Journal of Electron Spectroscopy and Related Phenomena 156. p.303-306- Abstract
- The X-ray photoabsorption spectra of ZrO2 films with different phase compositions were measured. The analysis of the results obtained shows that due to the site-sensitivity the X-ray photoabsorption spectroscopy is an attractive method for characterization of the ZrO2 structure. This allows application of the X-ray spectroscopy in investigation of the crystal structure in the various stages of the thin film growth including the initial stage of the ZrO2 growth. (c) 2006 Elsevier B.V. All rights reserved.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/663537
- author
- Kikas, A. ; Aarik, J. ; Kisand, V. ; Kooser, K. ; Kaambre, T. ; Mandar, H. ; Uustare, T. ; Rammula, R. ; Sammelselg, V. and Martinson, Indrek LU
- organization
- publishing date
- 2007
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- atomic layer deposition, zirconium dioxide, X-ray absorption spectra
- in
- Journal of Electron Spectroscopy and Related Phenomena
- volume
- 156
- pages
- 303 - 306
- publisher
- Elsevier
- external identifiers
-
- wos:000246726300314
- scopus:34247173343
- ISSN
- 0368-2048
- DOI
- 10.1016/j.elspec.2006.11.031
- language
- English
- LU publication?
- yes
- id
- 0e70c826-f090-4871-9795-6c32aac368b3 (old id 663537)
- date added to LUP
- 2016-04-01 16:52:20
- date last changed
- 2022-01-28 22:44:52
@article{0e70c826-f090-4871-9795-6c32aac368b3, abstract = {{The X-ray photoabsorption spectra of ZrO2 films with different phase compositions were measured. The analysis of the results obtained shows that due to the site-sensitivity the X-ray photoabsorption spectroscopy is an attractive method for characterization of the ZrO2 structure. This allows application of the X-ray spectroscopy in investigation of the crystal structure in the various stages of the thin film growth including the initial stage of the ZrO2 growth. (c) 2006 Elsevier B.V. All rights reserved.}}, author = {{Kikas, A. and Aarik, J. and Kisand, V. and Kooser, K. and Kaambre, T. and Mandar, H. and Uustare, T. and Rammula, R. and Sammelselg, V. and Martinson, Indrek}}, issn = {{0368-2048}}, keywords = {{atomic layer deposition; zirconium dioxide; X-ray absorption spectra}}, language = {{eng}}, pages = {{303--306}}, publisher = {{Elsevier}}, series = {{Journal of Electron Spectroscopy and Related Phenomena}}, title = {{Effect of phase composition on X-ray absorption spectra of ZrO2 thin films}}, url = {{http://dx.doi.org/10.1016/j.elspec.2006.11.031}}, doi = {{10.1016/j.elspec.2006.11.031}}, volume = {{156}}, year = {{2007}}, }