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Radiation detector resolution over a continuous energy range

Zhang, Yanwen; Milbrath, Brian D.; Weber, William J.; Elfman, Mikael LU and Whitlow, Harry J LU (2007) In Applied Physics Letters 91(9).
Abstract
An ion approach is demonstrated to determine energy resolution in both semiconductor detectors and scintillators over a continuous energy range. For semiconductors, the energy resolution of a silicon detector was measured as a function of helium ion energy, and the values from extrapolation to high energies are in good agreement with the literature data from alpha measurements. For scintillators, benchmark crystals subject to He+ irradiation were investigated, and the agreement of energy resolution between the ion and gamma measurements indicates that the ion approach can be used to predict the energy resolution of the candidate materials in thin-film form or small crystals when large crystals necessary for gamma-ray measurements are... (More)
An ion approach is demonstrated to determine energy resolution in both semiconductor detectors and scintillators over a continuous energy range. For semiconductors, the energy resolution of a silicon detector was measured as a function of helium ion energy, and the values from extrapolation to high energies are in good agreement with the literature data from alpha measurements. For scintillators, benchmark crystals subject to He+ irradiation were investigated, and the agreement of energy resolution between the ion and gamma measurements indicates that the ion approach can be used to predict the energy resolution of the candidate materials in thin-film form or small crystals when large crystals necessary for gamma-ray measurements are unavailable. (Less)
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics Letters
volume
91
issue
9
publisher
American Institute of Physics
external identifiers
  • wos:000249156100151
  • scopus:34548398496
ISSN
0003-6951
DOI
10.1063/1.2776978
language
English
LU publication?
yes
id
d7828aa1-5d40-4aad-9af8-7cc1d8339338 (old id 688437)
date added to LUP
2007-12-19 10:40:27
date last changed
2017-10-22 03:53:19
@article{d7828aa1-5d40-4aad-9af8-7cc1d8339338,
  abstract     = {An ion approach is demonstrated to determine energy resolution in both semiconductor detectors and scintillators over a continuous energy range. For semiconductors, the energy resolution of a silicon detector was measured as a function of helium ion energy, and the values from extrapolation to high energies are in good agreement with the literature data from alpha measurements. For scintillators, benchmark crystals subject to He+ irradiation were investigated, and the agreement of energy resolution between the ion and gamma measurements indicates that the ion approach can be used to predict the energy resolution of the candidate materials in thin-film form or small crystals when large crystals necessary for gamma-ray measurements are unavailable.},
  author       = {Zhang, Yanwen and Milbrath, Brian D. and Weber, William J. and Elfman, Mikael and Whitlow, Harry J},
  issn         = {0003-6951},
  language     = {eng},
  number       = {9},
  publisher    = {American Institute of Physics},
  series       = {Applied Physics Letters},
  title        = {Radiation detector resolution over a continuous energy range},
  url          = {http://dx.doi.org/10.1063/1.2776978},
  volume       = {91},
  year         = {2007},
}