Radiation detector resolution over a continuous energy range
(2007) In Applied Physics Letters 91(9).- Abstract
- An ion approach is demonstrated to determine energy resolution in both semiconductor detectors and scintillators over a continuous energy range. For semiconductors, the energy resolution of a silicon detector was measured as a function of helium ion energy, and the values from extrapolation to high energies are in good agreement with the literature data from alpha measurements. For scintillators, benchmark crystals subject to He+ irradiation were investigated, and the agreement of energy resolution between the ion and gamma measurements indicates that the ion approach can be used to predict the energy resolution of the candidate materials in thin-film form or small crystals when large crystals necessary for gamma-ray measurements are... (More)
- An ion approach is demonstrated to determine energy resolution in both semiconductor detectors and scintillators over a continuous energy range. For semiconductors, the energy resolution of a silicon detector was measured as a function of helium ion energy, and the values from extrapolation to high energies are in good agreement with the literature data from alpha measurements. For scintillators, benchmark crystals subject to He+ irradiation were investigated, and the agreement of energy resolution between the ion and gamma measurements indicates that the ion approach can be used to predict the energy resolution of the candidate materials in thin-film form or small crystals when large crystals necessary for gamma-ray measurements are unavailable. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/688437
- author
- Zhang, Yanwen ; Milbrath, Brian D. ; Weber, William J. ; Elfman, Mikael LU and Whitlow, Harry J LU
- organization
- publishing date
- 2007
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Applied Physics Letters
- volume
- 91
- issue
- 9
- publisher
- American Institute of Physics (AIP)
- external identifiers
-
- wos:000249156100151
- scopus:34548398496
- ISSN
- 0003-6951
- DOI
- 10.1063/1.2776978
- language
- English
- LU publication?
- yes
- additional info
- The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Nuclear Physics (Faculty of Technology) (011013007)
- id
- d7828aa1-5d40-4aad-9af8-7cc1d8339338 (old id 688437)
- date added to LUP
- 2016-04-01 12:26:18
- date last changed
- 2022-02-11 06:58:44
@article{d7828aa1-5d40-4aad-9af8-7cc1d8339338, abstract = {{An ion approach is demonstrated to determine energy resolution in both semiconductor detectors and scintillators over a continuous energy range. For semiconductors, the energy resolution of a silicon detector was measured as a function of helium ion energy, and the values from extrapolation to high energies are in good agreement with the literature data from alpha measurements. For scintillators, benchmark crystals subject to He+ irradiation were investigated, and the agreement of energy resolution between the ion and gamma measurements indicates that the ion approach can be used to predict the energy resolution of the candidate materials in thin-film form or small crystals when large crystals necessary for gamma-ray measurements are unavailable.}}, author = {{Zhang, Yanwen and Milbrath, Brian D. and Weber, William J. and Elfman, Mikael and Whitlow, Harry J}}, issn = {{0003-6951}}, language = {{eng}}, number = {{9}}, publisher = {{American Institute of Physics (AIP)}}, series = {{Applied Physics Letters}}, title = {{Radiation detector resolution over a continuous energy range}}, url = {{http://dx.doi.org/10.1063/1.2776978}}, doi = {{10.1063/1.2776978}}, volume = {{91}}, year = {{2007}}, }