Test Scheduling of Modular System-on-Chip under Capture Power Constraint
Tudu, Jaynarayan T. ; Larsson, Erik LU
and Singh, Virendra
(2010)
IEEE Eleventh Workshop on RTL and High Level Testing, 2010
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2340872
- author
- Tudu, Jaynarayan T.
; Larsson, Erik
LU
and Singh, Virendra
- publishing date
- 2010
- type
- Contribution to conference
- publication status
- published
- subject
- conference name
- IEEE Eleventh Workshop on RTL and High Level Testing, 2010
- conference location
- Shanghai, China
- conference dates
- 2010-12-05 - 2012-12-06
- language
- English
- LU publication?
- no
- id
- 68ff90e4-f852-48e2-8a14-0faaaf1e36b2 (old id 2340872)
- date added to LUP
- 2016-04-04 13:59:18
- date last changed
- 2018-11-21 21:17:36
@misc{68ff90e4-f852-48e2-8a14-0faaaf1e36b2,
author = {{Tudu, Jaynarayan T. and Larsson, Erik and Singh, Virendra}},
language = {{eng}},
title = {{Test Scheduling of Modular System-on-Chip under Capture Power Constraint}},
year = {{2010}},
}