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Test Scheduling of Modular System-on-Chip under Capture Power Constraint

Tudu, Jaynarayan T.; Larsson, Erik LU and Singh, Virendra (2010) IEEE Eleventh Workshop on RTL and High Level Testing, 2010
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author
publishing date
type
Contribution to conference
publication status
published
subject
conference name
IEEE Eleventh Workshop on RTL and High Level Testing, 2010
conference location
Shanghai, China
conference dates
2010-12-05 - 2012-12-06
language
English
LU publication?
no
id
68ff90e4-f852-48e2-8a14-0faaaf1e36b2 (old id 2340872)
date added to LUP
2012-02-10 13:51:33
date last changed
2018-05-29 12:20:26
@misc{68ff90e4-f852-48e2-8a14-0faaaf1e36b2,
  author       = {Tudu, Jaynarayan T. and Larsson, Erik and Singh, Virendra},
  language     = {eng},
  location     = {Shanghai, China},
  title        = {Test Scheduling of Modular System-on-Chip under Capture Power Constraint},
  year         = {2010},
}