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Direct Three-Dimensional Imaging of an X-ray Nanofocus Using a Single 60 nm Diameter Nanowire Device

Chayanun, Lert LU ; Hrachowina, Lukas LU ; Björling, Alexander LU ; Borgström, Magnus T. LU and Wallentin, Jesper LU (2020) In Nano Letters 20(11). p.8326-8331
Abstract

Nanoscale X-ray detectors could allow higher resolution in imaging and diffraction experiments than established systems but are difficult to design due to the long absorption length of X-rays. Here, we demonstrate X-ray detection in a single nanowire in which the nanowire axis is parallel to the optical axis. In this geometry, X-ray absorption can occur along the nanowire length, while the spatial resolution is limited by the diameter. We use the device to make a high-resolution 3D image of the 88 nm diameter X-ray nanofocus at the Nanomax beamline, MAX IV synchrotron, by scanning the single pixel device in different planes along the optical axis. The images reveal fine details of the beam that are unattainable with established... (More)

Nanoscale X-ray detectors could allow higher resolution in imaging and diffraction experiments than established systems but are difficult to design due to the long absorption length of X-rays. Here, we demonstrate X-ray detection in a single nanowire in which the nanowire axis is parallel to the optical axis. In this geometry, X-ray absorption can occur along the nanowire length, while the spatial resolution is limited by the diameter. We use the device to make a high-resolution 3D image of the 88 nm diameter X-ray nanofocus at the Nanomax beamline, MAX IV synchrotron, by scanning the single pixel device in different planes along the optical axis. The images reveal fine details of the beam that are unattainable with established detectors and show good agreement with ptychography.

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author
; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
detector, nanofocused X-rays, Nanowire, X-ray beam induced current
in
Nano Letters
volume
20
issue
11
pages
8326 - 8331
publisher
The American Chemical Society (ACS)
external identifiers
  • pmid:33084341
  • scopus:85096045461
ISSN
1530-6984
DOI
10.1021/acs.nanolett.0c03477
language
English
LU publication?
yes
id
6901a6b2-dd2a-45ab-a7be-c86874dbe3f5
date added to LUP
2020-11-24 14:49:36
date last changed
2024-02-17 07:06:59
@article{6901a6b2-dd2a-45ab-a7be-c86874dbe3f5,
  abstract     = {{<p>Nanoscale X-ray detectors could allow higher resolution in imaging and diffraction experiments than established systems but are difficult to design due to the long absorption length of X-rays. Here, we demonstrate X-ray detection in a single nanowire in which the nanowire axis is parallel to the optical axis. In this geometry, X-ray absorption can occur along the nanowire length, while the spatial resolution is limited by the diameter. We use the device to make a high-resolution 3D image of the 88 nm diameter X-ray nanofocus at the Nanomax beamline, MAX IV synchrotron, by scanning the single pixel device in different planes along the optical axis. The images reveal fine details of the beam that are unattainable with established detectors and show good agreement with ptychography. </p>}},
  author       = {{Chayanun, Lert and Hrachowina, Lukas and Björling, Alexander and Borgström, Magnus T. and Wallentin, Jesper}},
  issn         = {{1530-6984}},
  keywords     = {{detector; nanofocused X-rays; Nanowire; X-ray beam induced current}},
  language     = {{eng}},
  number       = {{11}},
  pages        = {{8326--8331}},
  publisher    = {{The American Chemical Society (ACS)}},
  series       = {{Nano Letters}},
  title        = {{Direct Three-Dimensional Imaging of an X-ray Nanofocus Using a Single 60 nm Diameter Nanowire Device}},
  url          = {{http://dx.doi.org/10.1021/acs.nanolett.0c03477}},
  doi          = {{10.1021/acs.nanolett.0c03477}},
  volume       = {{20}},
  year         = {{2020}},
}