X-ray photoelectron diffraction investigation of the cleavage plane in IT-transition metal dichalcogenides
(2007) In Physica B: Condensed Matter 398(1). p.172-177- Abstract
- We present a detailed study of the three members of the 1 T-transition metal dichalcogenides: TiSe2, TaSe2 and TaS2 by means of the X-ray photoelectron diffraction combined with single-scattering simulations. Our simulations of different surface terminations and their comparison with the measured diffraction patterns allow to determine that the cleavage occurs within the van der Waals gap. Singlescattering calculations are shown to simulate very well the measured diffractograms on these compounds. (c) 2007 Elsevier B.V. All rights reserved.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/691363
- author
- Stoltz, D. and Stoltz, Sven LU
- organization
- publishing date
- 2007
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- surfaces, surface structure, single crystal, computer simulations, X-ray diffraction, scattering
- in
- Physica B: Condensed Matter
- volume
- 398
- issue
- 1
- pages
- 172 - 177
- publisher
- Elsevier
- external identifiers
-
- wos:000248932900030
- scopus:34347247319
- ISSN
- 0921-4526
- DOI
- 10.1016/j.physb.2007.05.014
- language
- English
- LU publication?
- yes
- id
- 42d5b47c-69e4-49f0-be38-9df6983bfc67 (old id 691363)
- date added to LUP
- 2016-04-01 15:55:02
- date last changed
- 2022-01-28 08:00:36
@article{42d5b47c-69e4-49f0-be38-9df6983bfc67, abstract = {{We present a detailed study of the three members of the 1 T-transition metal dichalcogenides: TiSe2, TaSe2 and TaS2 by means of the X-ray photoelectron diffraction combined with single-scattering simulations. Our simulations of different surface terminations and their comparison with the measured diffraction patterns allow to determine that the cleavage occurs within the van der Waals gap. Singlescattering calculations are shown to simulate very well the measured diffractograms on these compounds. (c) 2007 Elsevier B.V. All rights reserved.}}, author = {{Stoltz, D. and Stoltz, Sven}}, issn = {{0921-4526}}, keywords = {{surfaces; surface structure; single crystal; computer simulations; X-ray diffraction; scattering}}, language = {{eng}}, number = {{1}}, pages = {{172--177}}, publisher = {{Elsevier}}, series = {{Physica B: Condensed Matter}}, title = {{X-ray photoelectron diffraction investigation of the cleavage plane in IT-transition metal dichalcogenides}}, url = {{http://dx.doi.org/10.1016/j.physb.2007.05.014}}, doi = {{10.1016/j.physb.2007.05.014}}, volume = {{398}}, year = {{2007}}, }