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Coupling between creep and redox behavior in nickel - yttria stabilized zirconia observed in-situ by monochromatic neutron imaging

Makowska, Malgorzata Grazyna; Kuhn, Luise Theil; Frandsen, Henrik Lund; Lauridsen, Erik Mejdal; De Angelis, Salvatore; Cleemann, Lars Nilausen; Morgano, Manuel; Trtik, Pavel and Strobl, Markus LU (2017) In Journal of Power Sources 340. p.167-175
Abstract

Ni-YSZ (nickel - yttria stabilized zirconia) is a material widely used for electrodes and supports in solid oxide electrochemical cells. The mechanical and electrochemical performance of these layers, and thus the whole cell, depends on their microstructure. During the initial operation of a cell, NiO is reduced to Ni. When this process is conducted under external load, like also present in a stack assembly, significant deformations of NiO/Ni-YSZ composite samples are observed. The observed creep is orders of magnitude larger than the one observed after reduction during operation. This phenomenon is referred to as accelerated creep and is expected to have a significant influence on the microstructure development and stress field present... (More)

Ni-YSZ (nickel - yttria stabilized zirconia) is a material widely used for electrodes and supports in solid oxide electrochemical cells. The mechanical and electrochemical performance of these layers, and thus the whole cell, depends on their microstructure. During the initial operation of a cell, NiO is reduced to Ni. When this process is conducted under external load, like also present in a stack assembly, significant deformations of NiO/Ni-YSZ composite samples are observed. The observed creep is orders of magnitude larger than the one observed after reduction during operation. This phenomenon is referred to as accelerated creep and is expected to have a significant influence on the microstructure development and stress field present in the Ni-YSZ in solid oxide electrochemical cells (SOCs), which is highly important for the durability of the SOC. In this work we present energy selective neutron imaging studies of the accelerated creep phenomenon in Ni/NiO-YSZ composite during reduction and also during oxidation. This approach allowed us to observe the phase transition and the creep behavior simultaneously in-situ under SOC operation-like conditions.

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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Creep, Neutron imaging, Ni-YSZ cermet, Solid oxide cells
in
Journal of Power Sources
volume
340
pages
9 pages
publisher
Elsevier
external identifiers
  • scopus:84998679666
ISSN
0378-7753
DOI
10.1016/j.jpowsour.2016.11.059
language
English
LU publication?
yes
id
6d4d2211-e413-4afe-912a-2a03fe0215a5
date added to LUP
2017-03-13 12:38:20
date last changed
2018-11-21 21:30:37
@article{6d4d2211-e413-4afe-912a-2a03fe0215a5,
  abstract     = {<p>Ni-YSZ (nickel - yttria stabilized zirconia) is a material widely used for electrodes and supports in solid oxide electrochemical cells. The mechanical and electrochemical performance of these layers, and thus the whole cell, depends on their microstructure. During the initial operation of a cell, NiO is reduced to Ni. When this process is conducted under external load, like also present in a stack assembly, significant deformations of NiO/Ni-YSZ composite samples are observed. The observed creep is orders of magnitude larger than the one observed after reduction during operation. This phenomenon is referred to as accelerated creep and is expected to have a significant influence on the microstructure development and stress field present in the Ni-YSZ in solid oxide electrochemical cells (SOCs), which is highly important for the durability of the SOC. In this work we present energy selective neutron imaging studies of the accelerated creep phenomenon in Ni/NiO-YSZ composite during reduction and also during oxidation. This approach allowed us to observe the phase transition and the creep behavior simultaneously in-situ under SOC operation-like conditions.</p>},
  author       = {Makowska, Malgorzata Grazyna and Kuhn, Luise Theil and Frandsen, Henrik Lund and Lauridsen, Erik Mejdal and De Angelis, Salvatore and Cleemann, Lars Nilausen and Morgano, Manuel and Trtik, Pavel and Strobl, Markus},
  issn         = {0378-7753},
  keyword      = {Creep,Neutron imaging,Ni-YSZ cermet,Solid oxide cells},
  language     = {eng},
  month        = {02},
  pages        = {167--175},
  publisher    = {Elsevier},
  series       = {Journal of Power Sources},
  title        = {Coupling between creep and redox behavior in nickel - yttria stabilized zirconia observed in-situ by monochromatic neutron imaging},
  url          = {http://dx.doi.org/10.1016/j.jpowsour.2016.11.059},
  volume       = {340},
  year         = {2017},
}