Skip to main content

Lund University Publications

LUND UNIVERSITY LIBRARIES

A new quantitative X-ray system for micro-PIXE analysis

Pallon, Jan LU ; De La Rosa, Nathaly LU ; Elfman, Mikael LU ; Kristiansson, Per LU ; Nilsson, E.J. Charlotta LU and Ros, Linus LU (2017) In X-Ray Spectrometry 46(5). p.319-324
Abstract

Particle Induced X-ray Emission is a well-established technique for quantitative elemental analysis down to trace levels. During microbeam analysis, where the beam is collimated and focused into a small spot, the beam current reduces to nA or less. The generation of characteristic X-rays is reduced in the same proportion, leading to long data-acquisition times. This can partly be compensated for by using detectors with a large solid angle. In this work, the performance of an annular eight-element silicon drift detector with a total solid angle of 261 msr is described. The initial calibration of the detector was performed using thin elemental standards. Charge measurement was carried out both in a Faraday Cup positioned after the sample... (More)

Particle Induced X-ray Emission is a well-established technique for quantitative elemental analysis down to trace levels. During microbeam analysis, where the beam is collimated and focused into a small spot, the beam current reduces to nA or less. The generation of characteristic X-rays is reduced in the same proportion, leading to long data-acquisition times. This can partly be compensated for by using detectors with a large solid angle. In this work, the performance of an annular eight-element silicon drift detector with a total solid angle of 261 msr is described. The initial calibration of the detector was performed using thin elemental standards. Charge measurement was carried out both in a Faraday Cup positioned after the sample and by a pre-sample electrostatic deflection system sampling the beam charge into another Faraday Cup. The two methods were used in parallel and compared during the calibration measurements. A recently installed Versa Module Europe (VME) based data acquisition system equipped with, for example, multi-hit time-to-digital converters, amplifiers, and 32-channel scalers, was used to record data in event-by-event mode for simultaneous data evaluation on multiple computers. Off-line dead time and pile-up corrections were made on the event data that was sorted into spectra and fitted with the GeoPIXE software. The pre-sample deflection charge measurement gave consistent values for the calibration, and this is an important observation implying that non-conductive and thick samples will be able to quantify without the use of internal standards.

(Less)
Please use this url to cite or link to this publication:
author
; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
X-Ray Spectrometry
volume
46
issue
5
pages
319 - 324
publisher
John Wiley & Sons Inc.
external identifiers
  • scopus:85019879313
  • wos:000409246400005
ISSN
0049-8246
DOI
10.1002/xrs.2779
language
English
LU publication?
yes
id
71ebbf4a-b7d3-4a76-a478-f061aaa5ca2a
date added to LUP
2017-06-15 11:39:00
date last changed
2024-04-14 12:37:34
@article{71ebbf4a-b7d3-4a76-a478-f061aaa5ca2a,
  abstract     = {{<p>Particle Induced X-ray Emission is a well-established technique for quantitative elemental analysis down to trace levels. During microbeam analysis, where the beam is collimated and focused into a small spot, the beam current reduces to nA or less. The generation of characteristic X-rays is reduced in the same proportion, leading to long data-acquisition times. This can partly be compensated for by using detectors with a large solid angle. In this work, the performance of an annular eight-element silicon drift detector with a total solid angle of 261 msr is described. The initial calibration of the detector was performed using thin elemental standards. Charge measurement was carried out both in a Faraday Cup positioned after the sample and by a pre-sample electrostatic deflection system sampling the beam charge into another Faraday Cup. The two methods were used in parallel and compared during the calibration measurements. A recently installed Versa Module Europe (VME) based data acquisition system equipped with, for example, multi-hit time-to-digital converters, amplifiers, and 32-channel scalers, was used to record data in event-by-event mode for simultaneous data evaluation on multiple computers. Off-line dead time and pile-up corrections were made on the event data that was sorted into spectra and fitted with the GeoPIXE software. The pre-sample deflection charge measurement gave consistent values for the calibration, and this is an important observation implying that non-conductive and thick samples will be able to quantify without the use of internal standards.</p>}},
  author       = {{Pallon, Jan and De La Rosa, Nathaly and Elfman, Mikael and Kristiansson, Per and Nilsson, E.J. Charlotta and Ros, Linus}},
  issn         = {{0049-8246}},
  language     = {{eng}},
  number       = {{5}},
  pages        = {{319--324}},
  publisher    = {{John Wiley & Sons Inc.}},
  series       = {{X-Ray Spectrometry}},
  title        = {{A new quantitative X-ray system for micro-PIXE analysis}},
  url          = {{http://dx.doi.org/10.1002/xrs.2779}},
  doi          = {{10.1002/xrs.2779}},
  volume       = {{46}},
  year         = {{2017}},
}