A new quantitative X-ray system for micro-PIXE analysis
(2017) In X-Ray Spectrometry 46(5). p.319-324- Abstract
Particle Induced X-ray Emission is a well-established technique for quantitative elemental analysis down to trace levels. During microbeam analysis, where the beam is collimated and focused into a small spot, the beam current reduces to nA or less. The generation of characteristic X-rays is reduced in the same proportion, leading to long data-acquisition times. This can partly be compensated for by using detectors with a large solid angle. In this work, the performance of an annular eight-element silicon drift detector with a total solid angle of 261 msr is described. The initial calibration of the detector was performed using thin elemental standards. Charge measurement was carried out both in a Faraday Cup positioned after the sample... (More)
Particle Induced X-ray Emission is a well-established technique for quantitative elemental analysis down to trace levels. During microbeam analysis, where the beam is collimated and focused into a small spot, the beam current reduces to nA or less. The generation of characteristic X-rays is reduced in the same proportion, leading to long data-acquisition times. This can partly be compensated for by using detectors with a large solid angle. In this work, the performance of an annular eight-element silicon drift detector with a total solid angle of 261 msr is described. The initial calibration of the detector was performed using thin elemental standards. Charge measurement was carried out both in a Faraday Cup positioned after the sample and by a pre-sample electrostatic deflection system sampling the beam charge into another Faraday Cup. The two methods were used in parallel and compared during the calibration measurements. A recently installed Versa Module Europe (VME) based data acquisition system equipped with, for example, multi-hit time-to-digital converters, amplifiers, and 32-channel scalers, was used to record data in event-by-event mode for simultaneous data evaluation on multiple computers. Off-line dead time and pile-up corrections were made on the event data that was sorted into spectra and fitted with the GeoPIXE software. The pre-sample deflection charge measurement gave consistent values for the calibration, and this is an important observation implying that non-conductive and thick samples will be able to quantify without the use of internal standards.
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- author
- Pallon, Jan LU ; De La Rosa, Nathaly LU ; Elfman, Mikael LU ; Kristiansson, Per LU ; Nilsson, E.J. Charlotta LU and Ros, Linus LU
- organization
- publishing date
- 2017-09
- type
- Contribution to journal
- publication status
- published
- subject
- in
- X-Ray Spectrometry
- volume
- 46
- issue
- 5
- pages
- 319 - 324
- publisher
- John Wiley & Sons Inc.
- external identifiers
-
- wos:000409246400005
- scopus:85019879313
- ISSN
- 0049-8246
- DOI
- 10.1002/xrs.2779
- language
- English
- LU publication?
- yes
- id
- 71ebbf4a-b7d3-4a76-a478-f061aaa5ca2a
- date added to LUP
- 2017-06-15 11:39:00
- date last changed
- 2024-09-02 02:08:30
@article{71ebbf4a-b7d3-4a76-a478-f061aaa5ca2a, abstract = {{<p>Particle Induced X-ray Emission is a well-established technique for quantitative elemental analysis down to trace levels. During microbeam analysis, where the beam is collimated and focused into a small spot, the beam current reduces to nA or less. The generation of characteristic X-rays is reduced in the same proportion, leading to long data-acquisition times. This can partly be compensated for by using detectors with a large solid angle. In this work, the performance of an annular eight-element silicon drift detector with a total solid angle of 261 msr is described. The initial calibration of the detector was performed using thin elemental standards. Charge measurement was carried out both in a Faraday Cup positioned after the sample and by a pre-sample electrostatic deflection system sampling the beam charge into another Faraday Cup. The two methods were used in parallel and compared during the calibration measurements. A recently installed Versa Module Europe (VME) based data acquisition system equipped with, for example, multi-hit time-to-digital converters, amplifiers, and 32-channel scalers, was used to record data in event-by-event mode for simultaneous data evaluation on multiple computers. Off-line dead time and pile-up corrections were made on the event data that was sorted into spectra and fitted with the GeoPIXE software. The pre-sample deflection charge measurement gave consistent values for the calibration, and this is an important observation implying that non-conductive and thick samples will be able to quantify without the use of internal standards.</p>}}, author = {{Pallon, Jan and De La Rosa, Nathaly and Elfman, Mikael and Kristiansson, Per and Nilsson, E.J. Charlotta and Ros, Linus}}, issn = {{0049-8246}}, language = {{eng}}, number = {{5}}, pages = {{319--324}}, publisher = {{John Wiley & Sons Inc.}}, series = {{X-Ray Spectrometry}}, title = {{A new quantitative X-ray system for micro-PIXE analysis}}, url = {{http://dx.doi.org/10.1002/xrs.2779}}, doi = {{10.1002/xrs.2779}}, volume = {{46}}, year = {{2017}}, }