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A new quantitative X-ray system for micro-PIXE analysis

Pallon, Jan LU ; De La Rosa, Nathaly LU ; Elfman, Mikael LU ; Kristiansson, Per LU ; Nilsson, E.J. Charlotta LU and Ros, Linus LU (2017) In X-Ray Spectrometry
Abstract

Particle Induced X-ray Emission is a well-established technique for quantitative elemental analysis down to trace levels. During microbeam analysis, where the beam is collimated and focused into a small spot, the beam current reduces to nA or less. The generation of characteristic X-rays is reduced in the same proportion, leading to long data-acquisition times. This can partly be compensated for by using detectors with a large solid angle. In this work, the performance of an annular eight-element silicon drift detector with a total solid angle of 261 msr is described. The initial calibration of the detector was performed using thin elemental standards. Charge measurement was carried out both in a Faraday Cup positioned after the sample... (More)

Particle Induced X-ray Emission is a well-established technique for quantitative elemental analysis down to trace levels. During microbeam analysis, where the beam is collimated and focused into a small spot, the beam current reduces to nA or less. The generation of characteristic X-rays is reduced in the same proportion, leading to long data-acquisition times. This can partly be compensated for by using detectors with a large solid angle. In this work, the performance of an annular eight-element silicon drift detector with a total solid angle of 261 msr is described. The initial calibration of the detector was performed using thin elemental standards. Charge measurement was carried out both in a Faraday Cup positioned after the sample and by a pre-sample electrostatic deflection system sampling the beam charge into another Faraday Cup. The two methods were used in parallel and compared during the calibration measurements. A recently installed Versa Module Europe (VME) based data acquisition system equipped with, for example, multi-hit time-to-digital converters, amplifiers, and 32-channel scalers, was used to record data in event-by-event mode for simultaneous data evaluation on multiple computers. Off-line dead time and pile-up corrections were made on the event data that was sorted into spectra and fitted with the GeoPIXE software. The pre-sample deflection charge measurement gave consistent values for the calibration, and this is an important observation implying that non-conductive and thick samples will be able to quantify without the use of internal standards.

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author
organization
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type
Contribution to journal
publication status
epub
subject
in
X-Ray Spectrometry
publisher
John Wiley & Sons
external identifiers
  • scopus:85019879313
ISSN
0049-8246
DOI
10.1002/xrs.2779
language
English
LU publication?
yes
id
71ebbf4a-b7d3-4a76-a478-f061aaa5ca2a
date added to LUP
2017-06-15 11:39:00
date last changed
2017-06-15 11:39:00
@article{71ebbf4a-b7d3-4a76-a478-f061aaa5ca2a,
  abstract     = {<p>Particle Induced X-ray Emission is a well-established technique for quantitative elemental analysis down to trace levels. During microbeam analysis, where the beam is collimated and focused into a small spot, the beam current reduces to nA or less. The generation of characteristic X-rays is reduced in the same proportion, leading to long data-acquisition times. This can partly be compensated for by using detectors with a large solid angle. In this work, the performance of an annular eight-element silicon drift detector with a total solid angle of 261 msr is described. The initial calibration of the detector was performed using thin elemental standards. Charge measurement was carried out both in a Faraday Cup positioned after the sample and by a pre-sample electrostatic deflection system sampling the beam charge into another Faraday Cup. The two methods were used in parallel and compared during the calibration measurements. A recently installed Versa Module Europe (VME) based data acquisition system equipped with, for example, multi-hit time-to-digital converters, amplifiers, and 32-channel scalers, was used to record data in event-by-event mode for simultaneous data evaluation on multiple computers. Off-line dead time and pile-up corrections were made on the event data that was sorted into spectra and fitted with the GeoPIXE software. The pre-sample deflection charge measurement gave consistent values for the calibration, and this is an important observation implying that non-conductive and thick samples will be able to quantify without the use of internal standards.</p>},
  author       = {Pallon, Jan and De La Rosa, Nathaly and Elfman, Mikael and Kristiansson, Per and Nilsson, E.J. Charlotta and Ros, Linus},
  issn         = {0049-8246},
  language     = {eng},
  month        = {05},
  publisher    = {John Wiley & Sons},
  series       = {X-Ray Spectrometry},
  title        = {A new quantitative X-ray system for micro-PIXE analysis},
  url          = {http://dx.doi.org/10.1002/xrs.2779},
  year         = {2017},
}