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Thermometry by micro and nanodevices

Isosaari, E.; Holmqvist, T. LU ; Meschke, M.; Heinonen, M. and Pekola, J. P. (2009) In European Physical Journal: Special Topics 172(1). p.323-332
Abstract

In this paper we briefly discuss the current provisional temperature scale of 2000 (PLTS-2000) for low temperatures. Electronic thermometry is presented and discussed, focusing on its potential in verifying and realizing a future temperature scale. The discussion covers secondary thermometers such as NIS and SIS thermometers and noise, shot noise and Coulomb blockade primary thermometers. The last one is discussed in more detail.

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author
publishing date
type
Contribution to journal
publication status
published
in
European Physical Journal: Special Topics
volume
172
issue
1
pages
10 pages
publisher
EDP Sciences
external identifiers
  • scopus:67650535969
ISSN
1951-6355
DOI
10.1140/epjst/e2009-01057-y
language
English
LU publication?
no
id
74dd3840-00c1-4249-8bd5-3926e0a7ebde
date added to LUP
2017-10-04 14:22:30
date last changed
2017-10-08 10:42:19
@article{74dd3840-00c1-4249-8bd5-3926e0a7ebde,
  abstract     = {<p>In this paper we briefly discuss the current provisional temperature scale of 2000 (PLTS-2000) for low temperatures. Electronic thermometry is presented and discussed, focusing on its potential in verifying and realizing a future temperature scale. The discussion covers secondary thermometers such as NIS and SIS thermometers and noise, shot noise and Coulomb blockade primary thermometers. The last one is discussed in more detail.</p>},
  author       = {Isosaari, E. and Holmqvist, T. and Meschke, M. and Heinonen, M. and Pekola, J. P.},
  issn         = {1951-6355},
  language     = {eng},
  number       = {1},
  pages        = {323--332},
  publisher    = {EDP Sciences},
  series       = {European Physical Journal: Special Topics},
  title        = {Thermometry by micro and nanodevices},
  url          = {http://dx.doi.org/10.1140/epjst/e2009-01057-y},
  volume       = {172},
  year         = {2009},
}