Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam
(2011) In Optics Express 19(16). p.15516-15524- Abstract
- We present results of a time-resolved pump-probe experiment where a Si sample was exposed to an intense 15 keV beam and its surface monitored by measuring the wavefront deformation of a reflected optical laser probe beam. By reconstructing and back propagating the wavefront, the deformed surface can be retrieved for each time step. The dynamics of the heat bump, build-up and relaxation, is followed with a spatial resolution in the nanometer range. The results are interpreted taking into account results of finite element method simulations. Due to its robustness and simplicity this method should find further developments at new x-ray light sources (FEL) or be used to gain understanding on thermo-dynamical behavior of highly excited... (More)
- We present results of a time-resolved pump-probe experiment where a Si sample was exposed to an intense 15 keV beam and its surface monitored by measuring the wavefront deformation of a reflected optical laser probe beam. By reconstructing and back propagating the wavefront, the deformed surface can be retrieved for each time step. The dynamics of the heat bump, build-up and relaxation, is followed with a spatial resolution in the nanometer range. The results are interpreted taking into account results of finite element method simulations. Due to its robustness and simplicity this method should find further developments at new x-ray light sources (FEL) or be used to gain understanding on thermo-dynamical behavior of highly excited materials. (C) 2011 Optical Society of America (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2161907
- author
- organization
- publishing date
- 2011
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Optics Express
- volume
- 19
- issue
- 16
- pages
- 15516 - 15524
- publisher
- Optical Society of America
- external identifiers
-
- wos:000293339200077
- scopus:79961088453
- ISSN
- 1094-4087
- DOI
- 10.1364/OE.19.015516
- language
- English
- LU publication?
- yes
- id
- 74ddd0d0-1ad9-44d1-b81a-f9d6e812ba0b (old id 2161907)
- date added to LUP
- 2016-04-01 13:05:26
- date last changed
- 2022-01-27 17:17:37
@article{74ddd0d0-1ad9-44d1-b81a-f9d6e812ba0b, abstract = {{We present results of a time-resolved pump-probe experiment where a Si sample was exposed to an intense 15 keV beam and its surface monitored by measuring the wavefront deformation of a reflected optical laser probe beam. By reconstructing and back propagating the wavefront, the deformed surface can be retrieved for each time step. The dynamics of the heat bump, build-up and relaxation, is followed with a spatial resolution in the nanometer range. The results are interpreted taking into account results of finite element method simulations. Due to its robustness and simplicity this method should find further developments at new x-ray light sources (FEL) or be used to gain understanding on thermo-dynamical behavior of highly excited materials. (C) 2011 Optical Society of America}}, author = {{Gaudin, J. and Keitel, B. and Jurgilaitis, Andrius and Nüske, Ralf and Guerin, L. and Larsson, Jörgen and Mann, K. and Schaefer, B. and Tiedtke, K. and Trapp, A. and Tschentscher, Th and Yang, F. and Wulff, M. and Sinn, H. and Floeter, B.}}, issn = {{1094-4087}}, language = {{eng}}, number = {{16}}, pages = {{15516--15524}}, publisher = {{Optical Society of America}}, series = {{Optics Express}}, title = {{Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam}}, url = {{https://lup.lub.lu.se/search/files/3153570/2426299.pdf}}, doi = {{10.1364/OE.19.015516}}, volume = {{19}}, year = {{2011}}, }