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Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

Ketenoglu, Didem; Harder, Manuel; Klementiev, Konstantin LU ; Upton, Mary; Taherkhani, Mehran; Spiwek, Manfred; Dill, Frank-Uwe; Wille, Hans-Christian and Yavas, Hasan (2015) In Journal of Synchrotron Radiation 22. p.961-967
Abstract
An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
resonant inelastic X-ray scattering (RIXS), high energy-resolution, diced crystal analyzers, quartz
in
Journal of Synchrotron Radiation
volume
22
pages
961 - 967
publisher
Wiley-Blackwell
external identifiers
  • pmid:26134800
  • wos:000357407900012
  • scopus:84937433772
ISSN
1600-5775
DOI
10.1107/S1600577515009686
language
English
LU publication?
yes
id
042edf2d-4cbf-4cc9-b778-a75a13a6cf32 (old id 7790851)
date added to LUP
2015-09-03 09:42:07
date last changed
2017-07-02 03:51:51
@article{042edf2d-4cbf-4cc9-b778-a75a13a6cf32,
  abstract     = {An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.},
  author       = {Ketenoglu, Didem and Harder, Manuel and Klementiev, Konstantin and Upton, Mary and Taherkhani, Mehran and Spiwek, Manfred and Dill, Frank-Uwe and Wille, Hans-Christian and Yavas, Hasan},
  issn         = {1600-5775},
  keyword      = {resonant inelastic X-ray scattering (RIXS),high energy-resolution,diced crystal analyzers,quartz},
  language     = {eng},
  pages        = {961--967},
  publisher    = {Wiley-Blackwell},
  series       = {Journal of Synchrotron Radiation},
  title        = {Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge},
  url          = {http://dx.doi.org/10.1107/S1600577515009686},
  volume       = {22},
  year         = {2015},
}