GHz sample excitation at the ALBA-PEEM
(2023) In Ultramicroscopy 250.- Abstract
We describe a setup that is used for high-frequency electrical sample excitation in a cathode lens electron microscope with the sample stage at high voltage as used in many synchrotron light sources. Electrical signals are transmitted by dedicated high-frequency components to the printed circuit board supporting the sample. Sub-miniature push-on connectors (SMP) are used to realize the connection in the ultra-high vacuum chamber, bypassing the standard feedthrough. A bandwidth up to 4 GHz with -6 dB attenuation was measured at the sample position, which allows to apply sub-nanosecond pulses. We describe different electronic sample excitation schemes and demonstrate a spatial resolution of 56 nm employing the new setup.
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https://lup.lub.lu.se/record/7a69a57f-b9a4-40db-ab7d-e29090135b17
- author
- organization
- publishing date
- 2023
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- Cathode lens microscopy, Electronic modules, High frequency electrical excitations, LEEM-PEEM, Sample environment
- in
- Ultramicroscopy
- volume
- 250
- article number
- 113757
- publisher
- Elsevier
- external identifiers
-
- pmid:37207610
- scopus:85159591517
- ISSN
- 0304-3991
- DOI
- 10.1016/j.ultramic.2023.113757
- language
- English
- LU publication?
- yes
- id
- 7a69a57f-b9a4-40db-ab7d-e29090135b17
- date added to LUP
- 2023-08-16 15:51:16
- date last changed
- 2024-04-20 00:49:51
@article{7a69a57f-b9a4-40db-ab7d-e29090135b17, abstract = {{<p>We describe a setup that is used for high-frequency electrical sample excitation in a cathode lens electron microscope with the sample stage at high voltage as used in many synchrotron light sources. Electrical signals are transmitted by dedicated high-frequency components to the printed circuit board supporting the sample. Sub-miniature push-on connectors (SMP) are used to realize the connection in the ultra-high vacuum chamber, bypassing the standard feedthrough. A bandwidth up to 4 GHz with -6 dB attenuation was measured at the sample position, which allows to apply sub-nanosecond pulses. We describe different electronic sample excitation schemes and demonstrate a spatial resolution of 56 nm employing the new setup.</p>}}, author = {{Khaliq, Muhammad Waqas and Álvarez, José M. and Camps, Antonio and González, Nahikari and Ferrer, José and Martinez-Carboneres, Ana and Prat, Jordi and Ruiz-Gómez, Sandra and Niño, Miguel Angel and Macià, Ferran and Aballe, Lucia and Foerster, Michael}}, issn = {{0304-3991}}, keywords = {{Cathode lens microscopy; Electronic modules; High frequency electrical excitations; LEEM-PEEM; Sample environment}}, language = {{eng}}, publisher = {{Elsevier}}, series = {{Ultramicroscopy}}, title = {{GHz sample excitation at the ALBA-PEEM}}, url = {{http://dx.doi.org/10.1016/j.ultramic.2023.113757}}, doi = {{10.1016/j.ultramic.2023.113757}}, volume = {{250}}, year = {{2023}}, }