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GHz sample excitation at the ALBA-PEEM

Khaliq, Muhammad Waqas ; Álvarez, José M. ; Camps, Antonio ; González, Nahikari ; Ferrer, José ; Martinez-Carboneres, Ana LU ; Prat, Jordi ; Ruiz-Gómez, Sandra ; Niño, Miguel Angel and Macià, Ferran , et al. (2023) In Ultramicroscopy 250.
Abstract

We describe a setup that is used for high-frequency electrical sample excitation in a cathode lens electron microscope with the sample stage at high voltage as used in many synchrotron light sources. Electrical signals are transmitted by dedicated high-frequency components to the printed circuit board supporting the sample. Sub-miniature push-on connectors (SMP) are used to realize the connection in the ultra-high vacuum chamber, bypassing the standard feedthrough. A bandwidth up to 4 GHz with -6 dB attenuation was measured at the sample position, which allows to apply sub-nanosecond pulses. We describe different electronic sample excitation schemes and demonstrate a spatial resolution of 56 nm employing the new setup.

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organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Cathode lens microscopy, Electronic modules, High frequency electrical excitations, LEEM-PEEM, Sample environment
in
Ultramicroscopy
volume
250
article number
113757
publisher
Elsevier
external identifiers
  • pmid:37207610
  • scopus:85159591517
ISSN
0304-3991
DOI
10.1016/j.ultramic.2023.113757
language
English
LU publication?
yes
id
7a69a57f-b9a4-40db-ab7d-e29090135b17
date added to LUP
2023-08-16 15:51:16
date last changed
2024-04-20 00:49:51
@article{7a69a57f-b9a4-40db-ab7d-e29090135b17,
  abstract     = {{<p>We describe a setup that is used for high-frequency electrical sample excitation in a cathode lens electron microscope with the sample stage at high voltage as used in many synchrotron light sources. Electrical signals are transmitted by dedicated high-frequency components to the printed circuit board supporting the sample. Sub-miniature push-on connectors (SMP) are used to realize the connection in the ultra-high vacuum chamber, bypassing the standard feedthrough. A bandwidth up to 4 GHz with -6 dB attenuation was measured at the sample position, which allows to apply sub-nanosecond pulses. We describe different electronic sample excitation schemes and demonstrate a spatial resolution of 56 nm employing the new setup.</p>}},
  author       = {{Khaliq, Muhammad Waqas and Álvarez, José M. and Camps, Antonio and González, Nahikari and Ferrer, José and Martinez-Carboneres, Ana and Prat, Jordi and Ruiz-Gómez, Sandra and Niño, Miguel Angel and Macià, Ferran and Aballe, Lucia and Foerster, Michael}},
  issn         = {{0304-3991}},
  keywords     = {{Cathode lens microscopy; Electronic modules; High frequency electrical excitations; LEEM-PEEM; Sample environment}},
  language     = {{eng}},
  publisher    = {{Elsevier}},
  series       = {{Ultramicroscopy}},
  title        = {{GHz sample excitation at the ALBA-PEEM}},
  url          = {{http://dx.doi.org/10.1016/j.ultramic.2023.113757}},
  doi          = {{10.1016/j.ultramic.2023.113757}},
  volume       = {{250}},
  year         = {{2023}},
}