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Structural study by X-ray diffraction and transmission electron microscopy of the misfit compound (SbS1-xSex)1.16(Nb 1.036S2)2

Kars, Mohammed ; Fredrickson, Daniel C. ; Gómez-Herrero, A. ; Lidin, Sven ; Rebbah, Allaoua and Otero-Diáz, L. C. (2010) In Materials Research Bulletin 45(8). p.982-988
Abstract

In the Sb-Nb-S-Se system, a new misfit layer compound (MSL) has been synthesized and its structure was determined by combining single crystal X-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques. It presents a composite crystal structure formed by (SbS1-xSe x) slabs stacking alternately with double NbS2 layers and both can be treated as separate monoclinic subsystems. The (SbS 1-xSex) slabs comprise a distorted, two-atom-thick layer with NaCl-type structure formed by an array of {SbX5} square pyramids joined by edges (X: S, Se); the NbS2 layers consist of {NbS 6} trigonal prisms linked through edge-sharing to form sheets,... (More)

In the Sb-Nb-S-Se system, a new misfit layer compound (MSL) has been synthesized and its structure was determined by combining single crystal X-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques. It presents a composite crystal structure formed by (SbS1-xSe x) slabs stacking alternately with double NbS2 layers and both can be treated as separate monoclinic subsystems. The (SbS 1-xSex) slabs comprise a distorted, two-atom-thick layer with NaCl-type structure formed by an array of {SbX5} square pyramids joined by edges (X: S, Se); the NbS2 layers consist of {NbS 6} trigonal prisms linked through edge-sharing to form sheets, just as in the 2H-NbS2 structure type. Both sublattices have the same lattice parameters a = 5.7672(19) Å, c = 17.618(6) Å and β = 96.18(3)°, with incommensurability occurring along the b direction: b 1 =3.3442(13)Å for the NbS2 subsystem and b 2 = 2.8755(13)Å for the (SbS1-xSex) subsystem. The occurrence of diffuse scattering intensity streaked along c* indicates that the (SbS1-xSex) subsystem is subjected to extended defects along the stacking direction.

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author
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publishing date
type
Contribution to journal
publication status
published
keywords
Crystal growth, Crystal structure, Electron microscopy, Layered compound, X-ray diffraction
in
Materials Research Bulletin
volume
45
issue
8
pages
7 pages
publisher
Elsevier
external identifiers
  • scopus:77954217315
ISSN
0025-5408
DOI
10.1016/j.materresbull.2010.04.011
language
English
LU publication?
no
id
7f3af003-aa37-4982-80c3-2b97eadce0a0
date added to LUP
2019-04-08 14:59:36
date last changed
2022-01-31 18:46:44
@article{7f3af003-aa37-4982-80c3-2b97eadce0a0,
  abstract     = {{<p>In the Sb-Nb-S-Se system, a new misfit layer compound (MSL) has been synthesized and its structure was determined by combining single crystal X-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques. It presents a composite crystal structure formed by (SbS<sub>1-x</sub>Se <sub>x</sub>) slabs stacking alternately with double NbS<sub>2</sub> layers and both can be treated as separate monoclinic subsystems. The (SbS <sub>1-x</sub>Se<sub>x</sub>) slabs comprise a distorted, two-atom-thick layer with NaCl-type structure formed by an array of {SbX<sub>5</sub>} square pyramids joined by edges (X: S, Se); the NbS<sub>2</sub> layers consist of {NbS <sub>6</sub>} trigonal prisms linked through edge-sharing to form sheets, just as in the 2H-NbS<sub>2</sub> structure type. Both sublattices have the same lattice parameters a = 5.7672(19) Å, c = 17.618(6) Å and β = 96.18(3)°, with incommensurability occurring along the b direction: b <sub>1</sub> =3.3442(13)Å for the NbS<sub>2</sub> subsystem and b <sub>2</sub> = 2.8755(13)Å for the (SbS<sub>1-x</sub>Se<sub>x</sub>) subsystem. The occurrence of diffuse scattering intensity streaked along c* indicates that the (SbS<sub>1-x</sub>Se<sub>x</sub>) subsystem is subjected to extended defects along the stacking direction.</p>}},
  author       = {{Kars, Mohammed and Fredrickson, Daniel C. and Gómez-Herrero, A. and Lidin, Sven and Rebbah, Allaoua and Otero-Diáz, L. C.}},
  issn         = {{0025-5408}},
  keywords     = {{Crystal growth; Crystal structure; Electron microscopy; Layered compound; X-ray diffraction}},
  language     = {{eng}},
  month        = {{08}},
  number       = {{8}},
  pages        = {{982--988}},
  publisher    = {{Elsevier}},
  series       = {{Materials Research Bulletin}},
  title        = {{Structural study by X-ray diffraction and transmission electron microscopy of the misfit compound (SbS<sub>1-x</sub>Se<sub>x</sub>)<sub>1.16</sub>(Nb <sub>1.036</sub>S<sub>2</sub>)<sub>2</sub>}},
  url          = {{http://dx.doi.org/10.1016/j.materresbull.2010.04.011}},
  doi          = {{10.1016/j.materresbull.2010.04.011}},
  volume       = {{45}},
  year         = {{2010}},
}