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Access Time Minimization in IEEE 1687 Networks

Krenz-Baath, René; Ghani Zadegan, Farrokh LU and Larsson, Erik LU (2015) International Test Conference (ITC15) In [Host publication title missing] p.1-10
Abstract
IEEE 1687 enables flexible access to the embedded (on-chip) instruments that are needed for post-silicon validation, debugging, wafer sort, package test, burn-in, printed circuit board bring-up, printed circuit board assembly manufacturing test, power-on self-test, and in-field test. At any of these scenarios, the instruments are accessed differently, and at a given scenario the instruments are accessed differently over time. It means the IEEE 1687 network needs to be frequently reconfigured from accessing one set of instruments to accessing a different set of instruments. Due to the need of frequent reconfiguration of the IEEE 1687 network it is important to (1) minimize the run-time for the algorithm finding the new reconfiguration, and... (More)
IEEE 1687 enables flexible access to the embedded (on-chip) instruments that are needed for post-silicon validation, debugging, wafer sort, package test, burn-in, printed circuit board bring-up, printed circuit board assembly manufacturing test, power-on self-test, and in-field test. At any of these scenarios, the instruments are accessed differently, and at a given scenario the instruments are accessed differently over time. It means the IEEE 1687 network needs to be frequently reconfigured from accessing one set of instruments to accessing a different set of instruments. Due to the need of frequent reconfiguration of the IEEE 1687 network it is important to (1) minimize the run-time for the algorithm finding the new reconfiguration, and (2) generate scan vectors with minimized access time. In this paper we model the reconfiguration problem using Boolean Satisfiability Problem (SAT). Compared to previous works we show significant reduction in run-time and we ensure minimal access time for the generated scan vectors. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
IEEE Std. 1687, retargeting, upper bound calculation, access time minimization
in
[Host publication title missing]
pages
10 pages
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
International Test Conference (ITC15)
external identifiers
  • scopus:84958591893
ISBN
978-1-4673-6578-9
DOI
10.1109/TEST.2015.7342408
language
English
LU publication?
yes
id
3711785b-5930-4b8f-bbc5-9b9f1aaa0206 (old id 8055367)
date added to LUP
2015-10-13 13:08:06
date last changed
2017-06-25 04:44:45
@inproceedings{3711785b-5930-4b8f-bbc5-9b9f1aaa0206,
  abstract     = {IEEE 1687 enables flexible access to the embedded (on-chip) instruments that are needed for post-silicon validation, debugging, wafer sort, package test, burn-in, printed circuit board bring-up, printed circuit board assembly manufacturing test, power-on self-test, and in-field test. At any of these scenarios, the instruments are accessed differently, and at a given scenario the instruments are accessed differently over time. It means the IEEE 1687 network needs to be frequently reconfigured from accessing one set of instruments to accessing a different set of instruments. Due to the need of frequent reconfiguration of the IEEE 1687 network it is important to (1) minimize the run-time for the algorithm finding the new reconfiguration, and (2) generate scan vectors with minimized access time. In this paper we model the reconfiguration problem using Boolean Satisfiability Problem (SAT). Compared to previous works we show significant reduction in run-time and we ensure minimal access time for the generated scan vectors.},
  author       = {Krenz-Baath, René and Ghani Zadegan, Farrokh and Larsson, Erik},
  booktitle    = {[Host publication title missing]},
  isbn         = {978-1-4673-6578-9},
  keyword      = {IEEE Std. 1687,retargeting,upper bound calculation,access time minimization},
  language     = {eng},
  pages        = {1--10},
  publisher    = {IEEE--Institute of Electrical and Electronics Engineers Inc.},
  title        = {Access Time Minimization in IEEE 1687 Networks},
  url          = {http://dx.doi.org/10.1109/TEST.2015.7342408},
  year         = {2015},
}