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Artifacts in Absorption Measurements of Organometal Halide Perovskite Materials: What Are the Real Spectra?

Tian, Yuxi LU and Scheblykin, Ivan LU (2015) In The Journal of Physical Chemistry Letters 6(17). p.3466-3470
Abstract
Organometal halide (OMH) perovskites have attracted lots of attention over the last several years due to their very promising performance as the materials for solar cells and light-emitting devices. Photophysical processes in these hybrid organic inorganic semiconductors are still heavily debated. To know precise absorption spectra is absolutely necessary for quantitative understanding of the fundamental properties of OMH perovskites. We show that to measure the absorption of perovskite materials correctly is a difficult task which could be easily overlooked by the community. Many of the published absorption spectra exhibit a characteristic step-like featureless shape due to light scattering, high optical density of individual perovskite... (More)
Organometal halide (OMH) perovskites have attracted lots of attention over the last several years due to their very promising performance as the materials for solar cells and light-emitting devices. Photophysical processes in these hybrid organic inorganic semiconductors are still heavily debated. To know precise absorption spectra is absolutely necessary for quantitative understanding of the fundamental properties of OMH perovskites. We show that to measure the absorption of perovskite materials correctly is a difficult task which could be easily overlooked by the community. Many of the published absorption spectra exhibit a characteristic step-like featureless shape due to light scattering, high optical density of individual perovskite crystals and poor coverage of the substrate. We show how to recognize these artifacts, to avoid them, and to use absorption spectra of films for estimation of the surface coverage ratio. (Less)
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
The Journal of Physical Chemistry Letters
volume
6
issue
17
pages
3466 - 3470
publisher
The American Chemical Society
external identifiers
  • wos:000360953300023
ISSN
1948-7185
DOI
10.1021/acs.jpclett.5b01406
language
English
LU publication?
yes
id
8226ea62-3937-4c43-848a-e33151984e9b (old id 8077206)
date added to LUP
2015-10-23 09:51:12
date last changed
2016-09-20 04:30:48
@misc{8226ea62-3937-4c43-848a-e33151984e9b,
  abstract     = {Organometal halide (OMH) perovskites have attracted lots of attention over the last several years due to their very promising performance as the materials for solar cells and light-emitting devices. Photophysical processes in these hybrid organic inorganic semiconductors are still heavily debated. To know precise absorption spectra is absolutely necessary for quantitative understanding of the fundamental properties of OMH perovskites. We show that to measure the absorption of perovskite materials correctly is a difficult task which could be easily overlooked by the community. Many of the published absorption spectra exhibit a characteristic step-like featureless shape due to light scattering, high optical density of individual perovskite crystals and poor coverage of the substrate. We show how to recognize these artifacts, to avoid them, and to use absorption spectra of films for estimation of the surface coverage ratio.},
  author       = {Tian, Yuxi and Scheblykin, Ivan},
  issn         = {1948-7185},
  language     = {eng},
  number       = {17},
  pages        = {3466--3470},
  publisher    = {The American Chemical Society},
  series       = {The Journal of Physical Chemistry Letters},
  title        = {Artifacts in Absorption Measurements of Organometal Halide Perovskite Materials: What Are the Real Spectra?},
  url          = {http://dx.doi.org/10.1021/acs.jpclett.5b01406},
  volume       = {6},
  year         = {2015},
}