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Soft X-ray Exposure Promotes Na Intercalation in Graphene Grown on Si-Face SiC

Watcharinyanon, Somsakul; Xia, Chao; Niu, Yuran LU ; Zakharov, Alexei LU ; Johansson, Leif I.; Yakimova, Rositza and Virojanadara, Chariya (2015) In Materials 8(8). p.4768-4777
Abstract
An investigation of how electron/photon beam exposures affect the intercalation rate of Na deposited on graphene prepared on Si-face SiC is presented. Focused radiation from a storage ring is used for soft X-ray exposures while the electron beam in a low energy electron microscope is utilized for electron exposures. The microscopy and core level spectroscopy data presented clearly show that the effect of soft X-ray exposure is significantly greater than of electron exposure, i.e., it produces a greater increase in the intercalation rate of Na. Heat transfer from the photoelectrons generated during soft X-ray exposure and by the electrons penetrating the sample during electron beam exposure is suggested to increase the local surface... (More)
An investigation of how electron/photon beam exposures affect the intercalation rate of Na deposited on graphene prepared on Si-face SiC is presented. Focused radiation from a storage ring is used for soft X-ray exposures while the electron beam in a low energy electron microscope is utilized for electron exposures. The microscopy and core level spectroscopy data presented clearly show that the effect of soft X-ray exposure is significantly greater than of electron exposure, i.e., it produces a greater increase in the intercalation rate of Na. Heat transfer from the photoelectrons generated during soft X-ray exposure and by the electrons penetrating the sample during electron beam exposure is suggested to increase the local surface temperature and thus the intercalation rate. The estimated electron flux density is 50 times greater for soft X-ray exposure compared to electron exposure, which explains the larger increase in the intercalation rate from soft X-ray exposure. Effects occurring with time only at room temperature are found to be fairly slow, but detectable. The graphene quality, i.e., domain/grain size and homogeneity, was also observed to be an important factor since exposure-induced effects occurred more rapidly on a graphene sample prepared in situ compared to on a furnace grown sample. (Less)
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
graphene on Si-face SiC, intercalation of Na, soft X-ray exposure, electron exposure
in
Materials
volume
8
issue
8
pages
4768 - 4777
publisher
MDPI AG
external identifiers
  • wos:000360643900010
  • scopus:84940061608
ISSN
1996-1944
DOI
10.3390/ma8084768
language
English
LU publication?
yes
id
02b24092-d3cf-47a1-a3de-679e9cb4f3e4 (old id 8077343)
date added to LUP
2015-10-22 15:50:35
date last changed
2017-01-01 05:34:56
@article{02b24092-d3cf-47a1-a3de-679e9cb4f3e4,
  abstract     = {An investigation of how electron/photon beam exposures affect the intercalation rate of Na deposited on graphene prepared on Si-face SiC is presented. Focused radiation from a storage ring is used for soft X-ray exposures while the electron beam in a low energy electron microscope is utilized for electron exposures. The microscopy and core level spectroscopy data presented clearly show that the effect of soft X-ray exposure is significantly greater than of electron exposure, i.e., it produces a greater increase in the intercalation rate of Na. Heat transfer from the photoelectrons generated during soft X-ray exposure and by the electrons penetrating the sample during electron beam exposure is suggested to increase the local surface temperature and thus the intercalation rate. The estimated electron flux density is 50 times greater for soft X-ray exposure compared to electron exposure, which explains the larger increase in the intercalation rate from soft X-ray exposure. Effects occurring with time only at room temperature are found to be fairly slow, but detectable. The graphene quality, i.e., domain/grain size and homogeneity, was also observed to be an important factor since exposure-induced effects occurred more rapidly on a graphene sample prepared in situ compared to on a furnace grown sample.},
  author       = {Watcharinyanon, Somsakul and Xia, Chao and Niu, Yuran and Zakharov, Alexei and Johansson, Leif I. and Yakimova, Rositza and Virojanadara, Chariya},
  issn         = {1996-1944},
  keyword      = {graphene on Si-face SiC,intercalation of Na,soft X-ray exposure,electron exposure},
  language     = {eng},
  number       = {8},
  pages        = {4768--4777},
  publisher    = {MDPI AG},
  series       = {Materials},
  title        = {Soft X-ray Exposure Promotes Na Intercalation in Graphene Grown on Si-Face SiC},
  url          = {http://dx.doi.org/10.3390/ma8084768},
  volume       = {8},
  year         = {2015},
}