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Carrier Recombination Dynamics in Sulfur-Doped InP Nanowires.

Zhang, Wei LU ; Lehmann, Sebastian LU ; Mergenthaler, Kilian LU ; Wallentin, Jesper LU ; Borgström, Magnus LU orcid ; Pistol, Mats-Erik LU and Yartsev, Arkady LU orcid (2015) In Nano Letters 15(11). p.7238-7244
Abstract
Measuring lifetime of photogenerated charges in semiconductor nanowires (NW) is important for understanding light-induced processes in these materials and is relevant for their photovoltaic and photodetector applications. In this paper, we investigate the dynamics of photogenerated charge carriers in a series of as-grown InP NW with different levels of sulfur (S) doping. We observe that photoluminescence (PL) decay time as well as integrated PL intensity decreases with increasing S doping. We attribute these observations to hole trapping with the trap density increased due to S-doping level followed by nonradiative recombination of trapped charges. This assignment is proven by observation of the trap saturation in three independent... (More)
Measuring lifetime of photogenerated charges in semiconductor nanowires (NW) is important for understanding light-induced processes in these materials and is relevant for their photovoltaic and photodetector applications. In this paper, we investigate the dynamics of photogenerated charge carriers in a series of as-grown InP NW with different levels of sulfur (S) doping. We observe that photoluminescence (PL) decay time as well as integrated PL intensity decreases with increasing S doping. We attribute these observations to hole trapping with the trap density increased due to S-doping level followed by nonradiative recombination of trapped charges. This assignment is proven by observation of the trap saturation in three independent experiments: via excitation power and repetition rate PL lifetime dependencies and by PL pump-probe experiment. (Less)
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author
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organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Nano Letters
volume
15
issue
11
pages
7238 - 7244
publisher
The American Chemical Society (ACS)
external identifiers
  • pmid:26421505
  • wos:000364725400011
  • scopus:84947080875
  • pmid:26421505
ISSN
1530-6992
DOI
10.1021/acs.nanolett.5b02022
language
English
LU publication?
yes
additional info
The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Synchrotron Radiation Research (011013009), Solid State Physics (011013006), Chemical Physics (S) (011001060)
id
ce8bee32-c746-45de-b8d1-8a0dc7022838 (old id 8159945)
date added to LUP
2016-04-01 11:04:38
date last changed
2024-10-07 20:11:30
@article{ce8bee32-c746-45de-b8d1-8a0dc7022838,
  abstract     = {{Measuring lifetime of photogenerated charges in semiconductor nanowires (NW) is important for understanding light-induced processes in these materials and is relevant for their photovoltaic and photodetector applications. In this paper, we investigate the dynamics of photogenerated charge carriers in a series of as-grown InP NW with different levels of sulfur (S) doping. We observe that photoluminescence (PL) decay time as well as integrated PL intensity decreases with increasing S doping. We attribute these observations to hole trapping with the trap density increased due to S-doping level followed by nonradiative recombination of trapped charges. This assignment is proven by observation of the trap saturation in three independent experiments: via excitation power and repetition rate PL lifetime dependencies and by PL pump-probe experiment.}},
  author       = {{Zhang, Wei and Lehmann, Sebastian and Mergenthaler, Kilian and Wallentin, Jesper and Borgström, Magnus and Pistol, Mats-Erik and Yartsev, Arkady}},
  issn         = {{1530-6992}},
  language     = {{eng}},
  number       = {{11}},
  pages        = {{7238--7244}},
  publisher    = {{The American Chemical Society (ACS)}},
  series       = {{Nano Letters}},
  title        = {{Carrier Recombination Dynamics in Sulfur-Doped InP Nanowires.}},
  url          = {{http://dx.doi.org/10.1021/acs.nanolett.5b02022}},
  doi          = {{10.1021/acs.nanolett.5b02022}},
  volume       = {{15}},
  year         = {{2015}},
}