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Repetitive ultrafast melting of InSb as an x-ray timing diagnostic

Allaf Navirian, Hengameh LU ; Enquist, Henrik LU orcid ; Hansen, Tue LU ; Mikkelsen, Anders LU ; Sondhauss, Peter LU ; Srivastava, Alok LU ; Zakharov, Alexei LU and Larsson, Jörgen LU orcid (2008) In Applied Physics Reviews 103(10). p.6-103510
Abstract
We have demonstrated the possibility of using repetitive ultrafast melting of InSb as a timing diagnostic in connection with visible-light pump/x-ray probe measurements at high-repetition-rate x-ray facilities. Although the sample was molten and regrown approximately 1x10(6) times, a distinct reduction in time-resolved x-ray reflectivity could be observed using a streak camera with a time resolution of 2.5 ps. The time-resolved x-ray reflectivity displayed this distinct decrease despite the fact that the average reflectivity of the sample had fallen to approximately 50% of its original value due to accumulated damage from the prolonged laser exposure. The topography of the laser-exposed sample was mapped using an optical microscope, a... (More)
We have demonstrated the possibility of using repetitive ultrafast melting of InSb as a timing diagnostic in connection with visible-light pump/x-ray probe measurements at high-repetition-rate x-ray facilities. Although the sample was molten and regrown approximately 1x10(6) times, a distinct reduction in time-resolved x-ray reflectivity could be observed using a streak camera with a time resolution of 2.5 ps. The time-resolved x-ray reflectivity displayed this distinct decrease despite the fact that the average reflectivity of the sample had fallen to approximately 50% of its original value due to accumulated damage from the prolonged laser exposure. The topography of the laser-exposed sample was mapped using an optical microscope, a stylus profilometer, photoelectron microscopy, and a scanning tunneling microscope. Although the surface of the sample is not flat following prolonged exposure at laser fluences above 15 mJ/cm(2), the atomic scale structure regrows, and thus, regenerates the sample on a nanosecond timescale. In the fluence range between 15 and 25 mJ/cm(2), the laser power is sufficient to melt the sample, while regrowth occurs with a sufficiently good structure to allow the extraction of timing information via ultrafast time-resolved x-ray measurements. This can be applied for timing purposes at synchrotron radiation and x-ray free-electron laser facilities. It is also noteworthy that we were able to reproduce the fluence dependencies of melting depth and disordering time previously obtained in single-shot, nonthermal melting experiments with higher temporal resolution. (Less)
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author
; ; ; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics Reviews
volume
103
issue
10
pages
6 - 103510
publisher
American Institute of Physics (AIP)
external identifiers
  • wos:000256303800031
  • scopus:44649178208
ISSN
1931-9401
DOI
10.1063/1.2932155
language
English
LU publication?
yes
id
82ee2690-8531-450c-8948-bf4d8920892c (old id 1201224)
date added to LUP
2016-04-01 12:21:56
date last changed
2022-01-27 02:43:10
@article{82ee2690-8531-450c-8948-bf4d8920892c,
  abstract     = {{We have demonstrated the possibility of using repetitive ultrafast melting of InSb as a timing diagnostic in connection with visible-light pump/x-ray probe measurements at high-repetition-rate x-ray facilities. Although the sample was molten and regrown approximately 1x10(6) times, a distinct reduction in time-resolved x-ray reflectivity could be observed using a streak camera with a time resolution of 2.5 ps. The time-resolved x-ray reflectivity displayed this distinct decrease despite the fact that the average reflectivity of the sample had fallen to approximately 50% of its original value due to accumulated damage from the prolonged laser exposure. The topography of the laser-exposed sample was mapped using an optical microscope, a stylus profilometer, photoelectron microscopy, and a scanning tunneling microscope. Although the surface of the sample is not flat following prolonged exposure at laser fluences above 15 mJ/cm(2), the atomic scale structure regrows, and thus, regenerates the sample on a nanosecond timescale. In the fluence range between 15 and 25 mJ/cm(2), the laser power is sufficient to melt the sample, while regrowth occurs with a sufficiently good structure to allow the extraction of timing information via ultrafast time-resolved x-ray measurements. This can be applied for timing purposes at synchrotron radiation and x-ray free-electron laser facilities. It is also noteworthy that we were able to reproduce the fluence dependencies of melting depth and disordering time previously obtained in single-shot, nonthermal melting experiments with higher temporal resolution.}},
  author       = {{Allaf Navirian, Hengameh and Enquist, Henrik and Hansen, Tue and Mikkelsen, Anders and Sondhauss, Peter and Srivastava, Alok and Zakharov, Alexei and Larsson, Jörgen}},
  issn         = {{1931-9401}},
  language     = {{eng}},
  number       = {{10}},
  pages        = {{6--103510}},
  publisher    = {{American Institute of Physics (AIP)}},
  series       = {{Applied Physics Reviews}},
  title        = {{Repetitive ultrafast melting of InSb as an x-ray timing diagnostic}},
  url          = {{http://dx.doi.org/10.1063/1.2932155}},
  doi          = {{10.1063/1.2932155}},
  volume       = {{103}},
  year         = {{2008}},
}