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Methods for measuring sub-pm rad vertical emittance at the Swiss Light Source

Breunlin, Jonas LU ; Andersson, Åke LU ; Milas, N.; Hernandez, A. Saa and Schlott, V. (2015) In Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment 803. p.55-64
Abstract
We report on methods capable of measuring a rms vertical electron beam size of 3 pm with a runs error of less than 10% at a diagnostic beamline at the Swiss Light Source (SLS). This corresponds to a vertical emittance 01 06 pm rad with a 20% rms error. We showed this capability by presenting the theoretical basis for, and the data from, a series of measurements on a stable beam at 1.6 pm rad vertical emittance at the SLS. The methods presented utilized either pi- or sigma-polarized synchrotron radiation (SR) in the visible to ultra violet (vis-UV) spectral range. In addition to the established g-polarization method, we introduced a diffraction method with a potentially high resolution capability. Also an intensity imbalanced diffraction... (More)
We report on methods capable of measuring a rms vertical electron beam size of 3 pm with a runs error of less than 10% at a diagnostic beamline at the Swiss Light Source (SLS). This corresponds to a vertical emittance 01 06 pm rad with a 20% rms error. We showed this capability by presenting the theoretical basis for, and the data from, a series of measurements on a stable beam at 1.6 pm rad vertical emittance at the SLS. The methods presented utilized either pi- or sigma-polarized synchrotron radiation (SR) in the visible to ultra violet (vis-UV) spectral range. In addition to the established g-polarization method, we introduced a diffraction method with a potentially high resolution capability. Also an intensity imbalanced diffraction scheme was introduced, but was found to be prone to SR induced carbon contamination on optical elements. (C) 2015 Elsevier B.V. All rights reserved. (Less)
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author
organization
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Contribution to journal
publication status
published
subject
keywords
Diffraction, Interferometry, Low emittance, Synchrotron radiation, pi-polarization
in
Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
volume
803
pages
55 - 64
publisher
Elsevier
external identifiers
  • wos:000363464600009
  • scopus:84942921009
ISSN
0167-5087
DOI
10.1016/j.nima.2015.09.032
language
English
LU publication?
yes
id
00cdfd27-a9b1-4f63-9d2e-5bce869074e0 (old id 8398180)
date added to LUP
2015-12-21 08:21:33
date last changed
2017-04-02 03:56:19
@article{00cdfd27-a9b1-4f63-9d2e-5bce869074e0,
  abstract     = {We report on methods capable of measuring a rms vertical electron beam size of 3 pm with a runs error of less than 10% at a diagnostic beamline at the Swiss Light Source (SLS). This corresponds to a vertical emittance 01 06 pm rad with a 20% rms error. We showed this capability by presenting the theoretical basis for, and the data from, a series of measurements on a stable beam at 1.6 pm rad vertical emittance at the SLS. The methods presented utilized either pi- or sigma-polarized synchrotron radiation (SR) in the visible to ultra violet (vis-UV) spectral range. In addition to the established g-polarization method, we introduced a diffraction method with a potentially high resolution capability. Also an intensity imbalanced diffraction scheme was introduced, but was found to be prone to SR induced carbon contamination on optical elements. (C) 2015 Elsevier B.V. All rights reserved.},
  author       = {Breunlin, Jonas and Andersson, Åke and Milas, N. and Hernandez, A. Saa and Schlott, V.},
  issn         = {0167-5087},
  keyword      = {Diffraction,Interferometry,Low emittance,Synchrotron radiation,pi-polarization},
  language     = {eng},
  pages        = {55--64},
  publisher    = {Elsevier},
  series       = {Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment},
  title        = {Methods for measuring sub-pm rad vertical emittance at the Swiss Light Source},
  url          = {http://dx.doi.org/10.1016/j.nima.2015.09.032},
  volume       = {803},
  year         = {2015},
}