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Invariance of multifractal spectrums of spatial forms on the surface of ZnxCd1-xTe – Si heterocompositions synthesized by electron beam epitaxy and hot wall epitaxy

Moskvin, P. P. ; Kryzhanivskyy, V. B. LU ; Rashkovetskyi, L. V. ; Rudnitskyi, V. A. ; Morozov, A. V. and Lytvyn, P. M. (2017) In Journal of Crystal Growth 475. p.144-149
Abstract

Multifractal (MF) analysis is applied for the description of spatial nanoforms which form a relief on a surface of heterostructures of ZnxCd1-xTe solid solution – substrate Si (1 1 1) synthesized by the method of the electron beam with the evaporating anode. The input data for the MF analysis were the AFM (atomic force microscopy) images of the surface of layers. Comparison of parameters of MF spectrums for different geometries of the surface relief of the layers obtained at identical temperatures and approximately identical growth rates by the above mentioned method of growth and the method of hot wall epitaxy has been performed. It was shown that within the error limits, MF spectrums of spatial nanoforms for... (More)

Multifractal (MF) analysis is applied for the description of spatial nanoforms which form a relief on a surface of heterostructures of ZnxCd1-xTe solid solution – substrate Si (1 1 1) synthesized by the method of the electron beam with the evaporating anode. The input data for the MF analysis were the AFM (atomic force microscopy) images of the surface of layers. Comparison of parameters of MF spectrums for different geometries of the surface relief of the layers obtained at identical temperatures and approximately identical growth rates by the above mentioned method of growth and the method of hot wall epitaxy has been performed. It was shown that within the error limits, MF spectrums of spatial nanoforms for heterostructures ZnxCd1-xTe – Si remained very similar under identical conditions for synthesis of layers for compared techniques.

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author
; ; ; ; and
publishing date
type
Contribution to journal
publication status
published
keywords
A1. Multifractal analysis, A1. Self-similarity and self-organization, A1. Surface structure, B1. Nanomaterials, B2. II-VI semiconductor materials
in
Journal of Crystal Growth
volume
475
pages
6 pages
publisher
Elsevier
external identifiers
  • scopus:85021276977
ISSN
0022-0248
DOI
10.1016/j.jcrysgro.2017.06.010
language
English
LU publication?
no
id
85fab09d-46a0-4fba-b794-d959a3dcce44
date added to LUP
2019-03-11 09:57:46
date last changed
2022-04-25 21:58:13
@article{85fab09d-46a0-4fba-b794-d959a3dcce44,
  abstract     = {{<p>Multifractal (MF) analysis is applied for the description of spatial nanoforms which form a relief on a surface of heterostructures of Zn<sub>x</sub>Cd<sub>1-x</sub>Te solid solution – substrate Si (1 1 1) synthesized by the method of the electron beam with the evaporating anode. The input data for the MF analysis were the AFM (atomic force microscopy) images of the surface of layers. Comparison of parameters of MF spectrums for different geometries of the surface relief of the layers obtained at identical temperatures and approximately identical growth rates by the above mentioned method of growth and the method of hot wall epitaxy has been performed. It was shown that within the error limits, MF spectrums of spatial nanoforms for heterostructures Zn<sub>x</sub>Cd<sub>1-x</sub>Te – Si remained very similar under identical conditions for synthesis of layers for compared techniques.</p>}},
  author       = {{Moskvin, P. P. and Kryzhanivskyy, V. B. and Rashkovetskyi, L. V. and Rudnitskyi, V. A. and Morozov, A. V. and Lytvyn, P. M.}},
  issn         = {{0022-0248}},
  keywords     = {{A1. Multifractal analysis; A1. Self-similarity and self-organization; A1. Surface structure; B1. Nanomaterials; B2. II-VI semiconductor materials}},
  language     = {{eng}},
  month        = {{10}},
  pages        = {{144--149}},
  publisher    = {{Elsevier}},
  series       = {{Journal of Crystal Growth}},
  title        = {{Invariance of multifractal spectrums of spatial forms on the surface of Zn<sub>x</sub>Cd<sub>1-x</sub>Te – Si heterocompositions synthesized by electron beam epitaxy and hot wall epitaxy}},
  url          = {{http://dx.doi.org/10.1016/j.jcrysgro.2017.06.010}},
  doi          = {{10.1016/j.jcrysgro.2017.06.010}},
  volume       = {{475}},
  year         = {{2017}},
}