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Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray

Takenaka, H.; Kuwabara, N.; Kamachi, N.; Liu, S. Y.; Endo, K.; Ohchi, T.; Ichimaru, S.; Kimura, H.; Laksman, J. LU and Hennies, F. LU , et al. (2018) 15th International Conference on X-Ray Lasers, ICXRL 2016 202. p.291-295
Abstract

The development of a high precision five rotation axes polarimeter using transmission multilayers as polarizers and reflection multilayers as analyzers is presented. In order to cover a wide energy range from EUV to soft X-ray, a set of Mo/Si, Cr/C, Sc/Cr, and W/B4C multilayers for transmission and reflection have been designed and fabricated. A hexapod support allows to align the polarimeter easily relative to the optical axis, and the instrument is designed to be moved conveniently between different beamlines.

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organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers
volume
202
pages
5 pages
publisher
Springer Science and Business Media, LLC
conference name
15th International Conference on X-Ray Lasers, ICXRL 2016
conference location
Nara, Japan
conference dates
2016-05-22 - 2016-05-27
external identifiers
  • scopus:85043346899
ISBN
9783319730240
DOI
10.1007/978-3-319-73025-7_43
language
English
LU publication?
yes
id
87a6c513-4437-4561-bd98-1cc2db420d83
date added to LUP
2018-03-22 13:51:47
date last changed
2019-02-20 11:11:34
@inproceedings{87a6c513-4437-4561-bd98-1cc2db420d83,
  abstract     = {<p>The development of a high precision five rotation axes polarimeter using transmission multilayers as polarizers and reflection multilayers as analyzers is presented. In order to cover a wide energy range from EUV to soft X-ray, a set of Mo/Si, Cr/C, Sc/Cr, and W/B<sub>4</sub>C multilayers for transmission and reflection have been designed and fabricated. A hexapod support allows to align the polarimeter easily relative to the optical axis, and the instrument is designed to be moved conveniently between different beamlines.</p>},
  author       = {Takenaka, H. and Kuwabara, N. and Kamachi, N. and Liu, S. Y. and Endo, K. and Ohchi, T. and Ichimaru, S. and Kimura, H. and Laksman, J. and Hennies, F. and Grizolli, W. and Sankari, R.},
  isbn         = {9783319730240},
  language     = {eng},
  location     = {Nara, Japan},
  pages        = {291--295},
  publisher    = {Springer Science and Business Media, LLC},
  title        = {Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray},
  url          = {http://dx.doi.org/10.1007/978-3-319-73025-7_43},
  volume       = {202},
  year         = {2018},
}