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Analysis of small-angle X-ray scattering data in the presence of significant instrumental smearing.

Bergenholtz, Johan LU ; Ulama, Jeanette and Zackrisson Oskolkova, Malin LU (2016) In Journal of Applied Crystallography 49(Pt 1). p.47-54
Abstract
A laboratory-scale small-angle X-ray scattering instrument with pinhole collimation has been used to assess smearing effects due to instrumental resolution. A new, numerically efficient method to smear ideal model intensities is developed and presented. It allows for directly using measured profiles of isotropic but otherwise arbitrary beams in smearing calculations. Samples of low-polydispersity polymer spheres have been used to show that scattering data can in this way be quantitatively modeled even when there is substantial distortion due to instrumental resolution.
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Journal of Applied Crystallography
volume
49
issue
Pt 1
pages
47 - 54
publisher
Wiley-Blackwell
external identifiers
  • pmid:26937235
  • scopus:84957057035
  • wos:000369389300006
ISSN
1600-5767
DOI
10.1107/S1600576715023444
language
English
LU publication?
yes
id
0b13367e-8eae-421f-8e8f-197698896b79 (old id 8856417)
date added to LUP
2016-03-23 15:37:18
date last changed
2017-10-01 03:26:08
@article{0b13367e-8eae-421f-8e8f-197698896b79,
  abstract     = {A laboratory-scale small-angle X-ray scattering instrument with pinhole collimation has been used to assess smearing effects due to instrumental resolution. A new, numerically efficient method to smear ideal model intensities is developed and presented. It allows for directly using measured profiles of isotropic but otherwise arbitrary beams in smearing calculations. Samples of low-polydispersity polymer spheres have been used to show that scattering data can in this way be quantitatively modeled even when there is substantial distortion due to instrumental resolution.},
  author       = {Bergenholtz, Johan and Ulama, Jeanette and Zackrisson Oskolkova, Malin},
  issn         = {1600-5767},
  language     = {eng},
  number       = {Pt 1},
  pages        = {47--54},
  publisher    = {Wiley-Blackwell},
  series       = {Journal of Applied Crystallography},
  title        = {Analysis of small-angle X-ray scattering data in the presence of significant instrumental smearing.},
  url          = {http://dx.doi.org/10.1107/S1600576715023444},
  volume       = {49},
  year         = {2016},
}