Analysis of small-angle X-ray scattering data in the presence of significant instrumental smearing.
(2016) In Journal of Applied Crystallography 49(Pt 1). p.47-54- Abstract
- A laboratory-scale small-angle X-ray scattering instrument with pinhole collimation has been used to assess smearing effects due to instrumental resolution. A new, numerically efficient method to smear ideal model intensities is developed and presented. It allows for directly using measured profiles of isotropic but otherwise arbitrary beams in smearing calculations. Samples of low-polydispersity polymer spheres have been used to show that scattering data can in this way be quantitatively modeled even when there is substantial distortion due to instrumental resolution.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/8856417
- author
- Bergenholtz, Johan LU ; Ulama, Jeanette and Zackrisson Oskolkova, Malin LU
- organization
- publishing date
- 2016
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Journal of Applied Crystallography
- volume
- 49
- issue
- Pt 1
- pages
- 47 - 54
- publisher
- International Union of Crystallography
- external identifiers
-
- pmid:26937235
- scopus:84957057035
- wos:000369389300006
- pmid:26937235
- ISSN
- 1600-5767
- DOI
- 10.1107/S1600576715023444
- language
- English
- LU publication?
- yes
- id
- 0b13367e-8eae-421f-8e8f-197698896b79 (old id 8856417)
- date added to LUP
- 2016-04-01 10:54:52
- date last changed
- 2022-02-10 07:12:34
@article{0b13367e-8eae-421f-8e8f-197698896b79, abstract = {{A laboratory-scale small-angle X-ray scattering instrument with pinhole collimation has been used to assess smearing effects due to instrumental resolution. A new, numerically efficient method to smear ideal model intensities is developed and presented. It allows for directly using measured profiles of isotropic but otherwise arbitrary beams in smearing calculations. Samples of low-polydispersity polymer spheres have been used to show that scattering data can in this way be quantitatively modeled even when there is substantial distortion due to instrumental resolution.}}, author = {{Bergenholtz, Johan and Ulama, Jeanette and Zackrisson Oskolkova, Malin}}, issn = {{1600-5767}}, language = {{eng}}, number = {{Pt 1}}, pages = {{47--54}}, publisher = {{International Union of Crystallography}}, series = {{Journal of Applied Crystallography}}, title = {{Analysis of small-angle X-ray scattering data in the presence of significant instrumental smearing.}}, url = {{http://dx.doi.org/10.1107/S1600576715023444}}, doi = {{10.1107/S1600576715023444}}, volume = {{49}}, year = {{2016}}, }