Characterization of the structure of mesoporous thin films grown at the air/water interface using X-ray surface techniques
Brennan, Tessa ; Roser, Stephen J. ; Mann, Stephen and Edler, Karen J. LU
(2003)
In Langmuir
19(7).
p.2639-2642
- Abstract
Grazing incidence X-ray diffraction (GIKD) and X-ray reflectivity have been used in situ to study the structure of surfactant-templated silica films grown at the air/water interface at different depths in the film. The results confirm that cylindrical silica-encased surfactant micelles are predominantly organized into a two-dimensional hexagonal structure, with the long axis parallel to the surface of the film. The arrangement of the micelles is well orientated near to the air/film interface but becomes disordered deeper into the sample. GIXD also reveals the existence of vertical channels extending down from the bottom of the film. This suggests a transition from in-plane to unconstrained growth.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/8de7fe9a-236e-4a8f-91e0-f29077d268b3
- author
- Brennan, Tessa
; Roser, Stephen J.
; Mann, Stephen
and Edler, Karen J.
LU
- publishing date
- 2003-04-01
- type
- Contribution to journal
- publication status
- published
- in
- Langmuir
- volume
- 19
- issue
- 7
- pages
- 4 pages
- publisher
- The American Chemical Society (ACS)
- external identifiers
-
- scopus:0037650202
- ISSN
- 0743-7463
- DOI
- 10.1021/la0203786
- language
- English
- LU publication?
- no
- id
- 8de7fe9a-236e-4a8f-91e0-f29077d268b3
- date added to LUP
- 2023-05-04 18:22:59
- date last changed
- 2023-06-13 12:24:50
@article{8de7fe9a-236e-4a8f-91e0-f29077d268b3,
abstract = {{<p>Grazing incidence X-ray diffraction (GIKD) and X-ray reflectivity have been used in situ to study the structure of surfactant-templated silica films grown at the air/water interface at different depths in the film. The results confirm that cylindrical silica-encased surfactant micelles are predominantly organized into a two-dimensional hexagonal structure, with the long axis parallel to the surface of the film. The arrangement of the micelles is well orientated near to the air/film interface but becomes disordered deeper into the sample. GIXD also reveals the existence of vertical channels extending down from the bottom of the film. This suggests a transition from in-plane to unconstrained growth.</p>}},
author = {{Brennan, Tessa and Roser, Stephen J. and Mann, Stephen and Edler, Karen J.}},
issn = {{0743-7463}},
language = {{eng}},
month = {{04}},
number = {{7}},
pages = {{2639--2642}},
publisher = {{The American Chemical Society (ACS)}},
series = {{Langmuir}},
title = {{Characterization of the structure of mesoporous thin films grown at the air/water interface using X-ray surface techniques}},
url = {{http://dx.doi.org/10.1021/la0203786}},
doi = {{10.1021/la0203786}},
volume = {{19}},
year = {{2003}},
}