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Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline

Chayanun, Lert LU ; Hammarberg, Susanna LU ; Dierks, Hanna LU ; Otnes, Gaute LU ; Björling, Alexander LU ; Borgström, Magnus T. LU and Wallentin, Jesper LU (2019) In Crystals 9(8).
Abstract

The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV, Sweden. The system was tested on single InP nanowire devices. The mechanical stability was sufficient to collect scanning XRD and XRF maps with... (More)

The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV, Sweden. The system was tested on single InP nanowire devices. The mechanical stability was sufficient to collect scanning XRD and XRF maps with a 50 nm diameter focus. The dark noise of the current measurement system was about 3 fA, which allowed fly scan measurements of X-ray beam induced current (XBIC) in single nanowire devices.

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author
; ; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Nanowire, Scanning X-ray diffraction (XRD), X-ray beam induced current (XBIC)
in
Crystals
volume
9
issue
8
article number
432
publisher
Multidisciplinary Digital Publishing Institute
external identifiers
  • scopus:85073368394
ISSN
2073-4352
DOI
10.3390/cryst9080432
language
English
LU publication?
yes
id
8e99c8a4-87d6-4c85-b531-50690f26989f
date added to LUP
2019-10-25 08:10:34
date last changed
2020-09-23 07:57:51
@article{8e99c8a4-87d6-4c85-b531-50690f26989f,
  abstract     = {<p>The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV, Sweden. The system was tested on single InP nanowire devices. The mechanical stability was sufficient to collect scanning XRD and XRF maps with a 50 nm diameter focus. The dark noise of the current measurement system was about 3 fA, which allowed fly scan measurements of X-ray beam induced current (XBIC) in single nanowire devices.</p>},
  author       = {Chayanun, Lert and Hammarberg, Susanna and Dierks, Hanna and Otnes, Gaute and Björling, Alexander and Borgström, Magnus T. and Wallentin, Jesper},
  issn         = {2073-4352},
  language     = {eng},
  month        = {08},
  number       = {8},
  publisher    = {Multidisciplinary Digital Publishing Institute},
  series       = {Crystals},
  title        = {Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline},
  url          = {http://dx.doi.org/10.3390/cryst9080432},
  doi          = {10.3390/cryst9080432},
  volume       = {9},
  year         = {2019},
}