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Quantitative Characterization of a Desalination Membrane Model System by X-ray Photoelectron Spectroscopy

Buechner, Christin ; Gericke, Sabrina M. LU ; Trotochaud, Lena ; Karslloǧlu, Osman ; Raso, Joseph and Bluhm, Hendrik (2019) In Langmuir 35(35). p.11315-11321
Abstract
Aromatic polyamide films form the active layer in reverse osmosis desalination membranes. Despite widespread use of this technology, it suffers from low rejection rates for certain water contaminants and from membrane fouling. Through a better understanding of the fundamental surface chemical processes during reverse osmosis desalination, advances in membrane and material design are expected. The recent invention of a molecular layer-by-layer (mLbL) preparation technique [Johnson, P. M.; Molecular Layer-by-Layer Deposition of Highly Crosslinked Polyamide Films. J. Polym. Sci., Part B: Polym. Phys. 2012, 50 (3), 168−173] yields films that are sufficiently smooth to warrant investigation with high-resolution microscopy and spectroscopy... (More)
Aromatic polyamide films form the active layer in reverse osmosis desalination membranes. Despite widespread use of this technology, it suffers from low rejection rates for certain water contaminants and from membrane fouling. Through a better understanding of the fundamental surface chemical processes during reverse osmosis desalination, advances in membrane and material design are expected. The recent invention of a molecular layer-by-layer (mLbL) preparation technique [Johnson, P. M.; Molecular Layer-by-Layer Deposition of Highly Crosslinked Polyamide Films. J. Polym. Sci., Part B: Polym. Phys. 2012, 50 (3), 168−173] yields films that are sufficiently smooth to warrant investigation with high-resolution microscopy and spectroscopy methods. We present high-resolution, quantitative X-ray photoelectron spectroscopy (XPS) data on the surface chemistry of ultrathin polyamide films that can serve as a model system for desalination membranes. We show that a quantitative analysis of the XPS spectra gives information about the functional groups of the film as well as other compounds present due to the synthesis under ambient conditions. Unpolymerized functional groups are identified and aid in understanding the degree of cross-linking. Investigation of polymers with synchrotron-based XPS requires taking beam-induced changes into account. We quantify X-ray beam damage and show that beam damage to the polyamide is limited, allowing long-term investigation of thin polyamide films. Characterizing mLbL-grown films via high-resolution XPS is the basis for a better understanding of the chemical interplay of polyamide surface functional groups with the major components of desalination systems. (Less)
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; ; ; ; and
publishing date
type
Contribution to journal
publication status
published
in
Langmuir
volume
35
issue
35
pages
7 pages
publisher
The American Chemical Society (ACS)
external identifiers
  • scopus:85071782715
ISSN
0743-7463
DOI
10.1021/acs.langmuir.9b01838
language
English
LU publication?
no
id
9480765a-0a7f-4c89-bbe2-d4933d38945c
date added to LUP
2024-04-15 10:26:17
date last changed
2024-04-16 04:01:26
@article{9480765a-0a7f-4c89-bbe2-d4933d38945c,
  abstract     = {{Aromatic polyamide films form the active layer in reverse osmosis desalination membranes. Despite widespread use of this technology, it suffers from low rejection rates for certain water contaminants and from membrane fouling. Through a better understanding of the fundamental surface chemical processes during reverse osmosis desalination, advances in membrane and material design are expected. The recent invention of a molecular layer-by-layer (mLbL) preparation technique [Johnson, P. M.; Molecular Layer-by-Layer Deposition of Highly Crosslinked Polyamide Films. J. Polym. Sci., Part B: Polym. Phys. 2012, 50 (3), 168−173] yields films that are sufficiently smooth to warrant investigation with high-resolution microscopy and spectroscopy methods. We present high-resolution, quantitative X-ray photoelectron spectroscopy (XPS) data on the surface chemistry of ultrathin polyamide films that can serve as a model system for desalination membranes. We show that a quantitative analysis of the XPS spectra gives information about the functional groups of the film as well as other compounds present due to the synthesis under ambient conditions. Unpolymerized functional groups are identified and aid in understanding the degree of cross-linking. Investigation of polymers with synchrotron-based XPS requires taking beam-induced changes into account. We quantify X-ray beam damage and show that beam damage to the polyamide is limited, allowing long-term investigation of thin polyamide films. Characterizing mLbL-grown films via high-resolution XPS is the basis for a better understanding of the chemical interplay of polyamide surface functional groups with the major components of desalination systems.}},
  author       = {{Buechner, Christin and Gericke, Sabrina M. and Trotochaud, Lena and Karslloǧlu, Osman and Raso, Joseph and Bluhm, Hendrik}},
  issn         = {{0743-7463}},
  language     = {{eng}},
  number       = {{35}},
  pages        = {{11315--11321}},
  publisher    = {{The American Chemical Society (ACS)}},
  series       = {{Langmuir}},
  title        = {{Quantitative Characterization of a Desalination Membrane Model System by X-ray Photoelectron Spectroscopy}},
  url          = {{http://dx.doi.org/10.1021/acs.langmuir.9b01838}},
  doi          = {{10.1021/acs.langmuir.9b01838}},
  volume       = {{35}},
  year         = {{2019}},
}