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Hard x-ray nanoprobe of beamline P06 at PETRA III

Schroer, C. G. ; Baumbach, C. ; Döhrmann, R. ; Klare, S. ; Hoppe, R. ; Kahnt, M. LU orcid ; Patommel, J. ; Reinhardt, J. ; Ritter, S. and Samberg, D. , et al. (2016) 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015 1741.
Abstract

The hard x-ray scanning microscope at beamline P06 of PETRA III at DESY in Hamburg serves a large user community, from physics, chemistry, and nanotechnology to the bio-medical, materials, environmental, and geosciences. It has been in user operation since 2012, and is mainly based on nanofocusing refractive x-ray lenses. Using refractive optics, nearly Gaussian-limited nanobeams in the range from 50 to 100 nm can be generated in the hard x-ray energy range from 8 to 30 keV. The degree of coherence can be traded off against the flux in the nanobeam by a two-stage focusing scheme. We give a brief overview on published results from this instrument and describe its most important components and parameters.

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publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
host publication
Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015
editor
Chubar, Oleg ; Jarrige, Ignace ; Kaznatcheev, Konstantine ; Miller, Lisa ; Stavitski, Eli ; Tanabe, Toshiya ; Shaftan, Timur ; Shen, Qun ; Pindak, Ronald ; Nelson, Christie ; Kalbfleisch, Sebastian ; Thieme, Juergen ; Williams, Garth ; Fuchs, Martin ; Rumaiz, Abdul ; Wang, Jun ; Evans-Lutterodt, Kenneth ; Lee, Wah-Keat ; McSweeney, Sean and Vescovo, Elio
volume
1741
article number
030007
publisher
American Institute of Physics (AIP)
conference name
12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015
conference location
New York, United States
conference dates
2015-07-06 - 2015-07-10
external identifiers
  • scopus:84984539161
ISBN
9780735413986
DOI
10.1063/1.4952830
language
English
LU publication?
no
id
a09a465d-605f-48fb-bb36-30c5adc7f622
date added to LUP
2019-10-12 12:55:08
date last changed
2023-11-19 16:57:17
@inproceedings{a09a465d-605f-48fb-bb36-30c5adc7f622,
  abstract     = {{<p>The hard x-ray scanning microscope at beamline P06 of PETRA III at DESY in Hamburg serves a large user community, from physics, chemistry, and nanotechnology to the bio-medical, materials, environmental, and geosciences. It has been in user operation since 2012, and is mainly based on nanofocusing refractive x-ray lenses. Using refractive optics, nearly Gaussian-limited nanobeams in the range from 50 to 100 nm can be generated in the hard x-ray energy range from 8 to 30 keV. The degree of coherence can be traded off against the flux in the nanobeam by a two-stage focusing scheme. We give a brief overview on published results from this instrument and describe its most important components and parameters.</p>}},
  author       = {{Schroer, C. G. and Baumbach, C. and Döhrmann, R. and Klare, S. and Hoppe, R. and Kahnt, M. and Patommel, J. and Reinhardt, J. and Ritter, S. and Samberg, D. and Scholz, M. and Schropp, A. and Seiboth, F. and Seyrich, M. and Wittwer, F. and Falkenberg, G.}},
  booktitle    = {{Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015}},
  editor       = {{Chubar, Oleg and Jarrige, Ignace and Kaznatcheev, Konstantine and Miller, Lisa and Stavitski, Eli and Tanabe, Toshiya and Shaftan, Timur and Shen, Qun and Pindak, Ronald and Nelson, Christie and Kalbfleisch, Sebastian and Thieme, Juergen and Williams, Garth and Fuchs, Martin and Rumaiz, Abdul and Wang, Jun and Evans-Lutterodt, Kenneth and Lee, Wah-Keat and McSweeney, Sean and Vescovo, Elio}},
  isbn         = {{9780735413986}},
  language     = {{eng}},
  month        = {{07}},
  publisher    = {{American Institute of Physics (AIP)}},
  title        = {{Hard x-ray nanoprobe of beamline P06 at PETRA III}},
  url          = {{http://dx.doi.org/10.1063/1.4952830}},
  doi          = {{10.1063/1.4952830}},
  volume       = {{1741}},
  year         = {{2016}},
}