An Even-Odd DFD Technique for Scan Chain Diagnosis
Rajesh, Venkat ; Larsson, Erik LU
; Gaur, Manoj S.
and Singh, Virendra
(2009)
Workshop on RTL and High Level Testing (WRTLT)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2340924
- author
- Rajesh, Venkat
; Larsson, Erik
LU
; Gaur, Manoj S.
and Singh, Virendra
- publishing date
- 2009
- type
- Contribution to conference
- publication status
- published
- subject
- conference name
- Workshop on RTL and High Level Testing (WRTLT)
- conference location
- Hongkong, China
- conference dates
- 2009-11-27 - 2009-11-28
- language
- English
- LU publication?
- no
- id
- a6d3de35-87d2-489a-bb99-15076d6f37d9 (old id 2340924)
- date added to LUP
- 2016-04-04 14:28:23
- date last changed
- 2018-11-21 21:20:31
@misc{a6d3de35-87d2-489a-bb99-15076d6f37d9,
author = {{Rajesh, Venkat and Larsson, Erik and Gaur, Manoj S. and Singh, Virendra}},
language = {{eng}},
title = {{An Even-Odd DFD Technique for Scan Chain Diagnosis}},
year = {{2009}},
}