XUV-induced transient phase gratings for probing ultra-fast carrier generation and recombination processes in wide-bandgap semiconductors
(2013) In Annalen der Physik 525(1-2). p.59-65- Abstract
- A method for probing the temporal evolution of ultra-fast carrier generation and recombination processes in wide-bandgap semiconductors, e.g. diamond, is described. Two extreme ultraviolet (pump) pulses produced by high-order harmonic generation in Argon gas (with a photon energy of 32 eV) are superimposed on a sample with a small angle between them, inducing periodic changes in the refractive index of the material causing it to act as a transient diffraction grating. A delayed synchronized infrared (probe) pulse gets diffracted on the induced phase grating and is detected in the first diffraction order. By varying the time-delay between pump and probe, the full temporal evolution of the free carrier generation and recombination processes... (More)
- A method for probing the temporal evolution of ultra-fast carrier generation and recombination processes in wide-bandgap semiconductors, e.g. diamond, is described. Two extreme ultraviolet (pump) pulses produced by high-order harmonic generation in Argon gas (with a photon energy of 32 eV) are superimposed on a sample with a small angle between them, inducing periodic changes in the refractive index of the material causing it to act as a transient diffraction grating. A delayed synchronized infrared (probe) pulse gets diffracted on the induced phase grating and is detected in the first diffraction order. By varying the time-delay between pump and probe, the full temporal evolution of the free carrier generation and recombination processes can be resolved. Feasibility calculations and the first steps towards experimental implementation are presented. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/3674538
- author
- Gabrysch, Markus ; Schwenke, Jörg LU ; Balciunas, Tadas ; He, Xinkui LU ; Rakowski, Rafal LU ; Johnsson, Per LU ; Canton, Sophie LU ; Isberg, Jan and L'Huillier, Anne LU
- organization
- publishing date
- 2013
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- Electron cascade, wide-bandgap semiconductor, ultrafast carrier, phenomena, XUV, pump-probe, transient phase grating, high-order harmonic, generation
- in
- Annalen der Physik
- volume
- 525
- issue
- 1-2
- pages
- 59 - 65
- publisher
- John Wiley & Sons Inc.
- external identifiers
-
- wos:000314918500013
- scopus:84875432168
- ISSN
- 0003-3804
- DOI
- 10.1002/andp.201200187
- language
- English
- LU publication?
- yes
- id
- a76392e5-5740-4cf7-b999-193a5f7e2863 (old id 3674538)
- date added to LUP
- 2016-04-01 13:41:21
- date last changed
- 2023-09-03 03:28:29
@article{a76392e5-5740-4cf7-b999-193a5f7e2863, abstract = {{A method for probing the temporal evolution of ultra-fast carrier generation and recombination processes in wide-bandgap semiconductors, e.g. diamond, is described. Two extreme ultraviolet (pump) pulses produced by high-order harmonic generation in Argon gas (with a photon energy of 32 eV) are superimposed on a sample with a small angle between them, inducing periodic changes in the refractive index of the material causing it to act as a transient diffraction grating. A delayed synchronized infrared (probe) pulse gets diffracted on the induced phase grating and is detected in the first diffraction order. By varying the time-delay between pump and probe, the full temporal evolution of the free carrier generation and recombination processes can be resolved. Feasibility calculations and the first steps towards experimental implementation are presented.}}, author = {{Gabrysch, Markus and Schwenke, Jörg and Balciunas, Tadas and He, Xinkui and Rakowski, Rafal and Johnsson, Per and Canton, Sophie and Isberg, Jan and L'Huillier, Anne}}, issn = {{0003-3804}}, keywords = {{Electron cascade; wide-bandgap semiconductor; ultrafast carrier; phenomena; XUV; pump-probe; transient phase grating; high-order harmonic; generation}}, language = {{eng}}, number = {{1-2}}, pages = {{59--65}}, publisher = {{John Wiley & Sons Inc.}}, series = {{Annalen der Physik}}, title = {{XUV-induced transient phase gratings for probing ultra-fast carrier generation and recombination processes in wide-bandgap semiconductors}}, url = {{http://dx.doi.org/10.1002/andp.201200187}}, doi = {{10.1002/andp.201200187}}, volume = {{525}}, year = {{2013}}, }