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Formation of mesostructured thin films at the air/water interface

Edler, Karen J. LU orcid ; Brennan, Tessa and Roser, Stephen J. (2006) In Thin Solid Films 495(1-2). p.2-10
Abstract

Mesostructured thin films are known to form at the interface between either air or a solid surface and a dilute acidic solution containing the silica precursor, and surfactant template. These films are transparent, and, when grown at the air/solution interface, self-supporting. We have been studying the formation processes of these films to try to understand and thus control the formation of both the mesoscale and the macroscale structure. The films are characterised using a variety of in situ methods including X-ray reflectivity techniques and Brewster angle microscopy, to study both the large and small scale structure development processes. As a result of our investigations we have suggested a coacervation driven mechanism for film... (More)

Mesostructured thin films are known to form at the interface between either air or a solid surface and a dilute acidic solution containing the silica precursor, and surfactant template. These films are transparent, and, when grown at the air/solution interface, self-supporting. We have been studying the formation processes of these films to try to understand and thus control the formation of both the mesoscale and the macroscale structure. The films are characterised using a variety of in situ methods including X-ray reflectivity techniques and Brewster angle microscopy, to study both the large and small scale structure development processes. As a result of our investigations we have suggested a coacervation driven mechanism for film growth and application of this understanding now drives our further development of these films. Here we present results concerning the effect of surfactant headgroup type, structure and counterions on the development of well-organised mesostructures, and also on the macroscopic film characteristics.

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author
; and
publishing date
type
Contribution to journal
publication status
published
keywords
Nanostructures, Self-assembly, Silicon oxide, Surfaces, interfaces and colloidal behaviour, Surfactant templating
in
Thin Solid Films
volume
495
issue
1-2
pages
9 pages
publisher
Elsevier
external identifiers
  • scopus:28044459456
ISSN
0040-6090
DOI
10.1016/j.tsf.2005.08.300
language
English
LU publication?
no
id
ab129414-5b2e-4890-8594-d55fde6bec64
date added to LUP
2023-05-04 19:00:14
date last changed
2023-06-13 09:23:13
@article{ab129414-5b2e-4890-8594-d55fde6bec64,
  abstract     = {{<p>Mesostructured thin films are known to form at the interface between either air or a solid surface and a dilute acidic solution containing the silica precursor, and surfactant template. These films are transparent, and, when grown at the air/solution interface, self-supporting. We have been studying the formation processes of these films to try to understand and thus control the formation of both the mesoscale and the macroscale structure. The films are characterised using a variety of in situ methods including X-ray reflectivity techniques and Brewster angle microscopy, to study both the large and small scale structure development processes. As a result of our investigations we have suggested a coacervation driven mechanism for film growth and application of this understanding now drives our further development of these films. Here we present results concerning the effect of surfactant headgroup type, structure and counterions on the development of well-organised mesostructures, and also on the macroscopic film characteristics.</p>}},
  author       = {{Edler, Karen J. and Brennan, Tessa and Roser, Stephen J.}},
  issn         = {{0040-6090}},
  keywords     = {{Nanostructures; Self-assembly; Silicon oxide; Surfaces, interfaces and colloidal behaviour; Surfactant templating}},
  language     = {{eng}},
  month        = {{01}},
  number       = {{1-2}},
  pages        = {{2--10}},
  publisher    = {{Elsevier}},
  series       = {{Thin Solid Films}},
  title        = {{Formation of mesostructured thin films at the air/water interface}},
  url          = {{http://dx.doi.org/10.1016/j.tsf.2005.08.300}},
  doi          = {{10.1016/j.tsf.2005.08.300}},
  volume       = {{495}},
  year         = {{2006}},
}