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Fluorescence correlation spectroscopy in thin films at reflecting substrates as a means to study nanoscale structure and dynamics at soft-matter interfaces

Täuber, Daniela LU ; Radscheit, Kathrin; Von Borczyskowski, Christian; Schulz, Michael and Osipov, Vladimir Al LU (2016) In Physical Review E - Statistical, Nonlinear, and Soft Matter Physics 94(1).
Abstract

Structure and dynamics at soft-matter interfaces play an important role in nature and technical applications. Optical single-molecule investigations are noninvasive and capable to reveal heterogeneities at the nanoscale. In this work we develop an autocorrelation function (ACF) approach to retrieve tracer diffusion parameters obtained from fluorescence correlation spectroscopy (FCS) experiments in thin liquid films at reflecting substrates. This approach then is used to investigate structure and dynamics in 100-nm-thick 8CB liquid crystal films on silicon wafers with five different oxide thicknesses. We find a different extension of the structural reorientation of 8CB at the solid-liquid interface for thin and for thick oxide. For the... (More)

Structure and dynamics at soft-matter interfaces play an important role in nature and technical applications. Optical single-molecule investigations are noninvasive and capable to reveal heterogeneities at the nanoscale. In this work we develop an autocorrelation function (ACF) approach to retrieve tracer diffusion parameters obtained from fluorescence correlation spectroscopy (FCS) experiments in thin liquid films at reflecting substrates. This approach then is used to investigate structure and dynamics in 100-nm-thick 8CB liquid crystal films on silicon wafers with five different oxide thicknesses. We find a different extension of the structural reorientation of 8CB at the solid-liquid interface for thin and for thick oxide. For the thin oxides, the perylenediimide tracer diffusion dynamics in general agrees with the hydrodynamic modeling using no-slip boundary conditions with only a small deviation close to the substrate, while a considerably stronger decrease of the interfacial tracer diffusion is found for the thick oxides.

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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Physical Review E - Statistical, Nonlinear, and Soft Matter Physics
volume
94
issue
1
publisher
American Physical Society
external identifiers
  • scopus:84980378351
  • wos:000380118300009
ISSN
1539-3755
DOI
10.1103/PhysRevE.94.012804
language
English
LU publication?
yes
id
ac71cd09-0303-45b5-afcd-6b3a2065c664
date added to LUP
2017-01-09 09:18:03
date last changed
2017-10-22 05:24:40
@article{ac71cd09-0303-45b5-afcd-6b3a2065c664,
  abstract     = {<p>Structure and dynamics at soft-matter interfaces play an important role in nature and technical applications. Optical single-molecule investigations are noninvasive and capable to reveal heterogeneities at the nanoscale. In this work we develop an autocorrelation function (ACF) approach to retrieve tracer diffusion parameters obtained from fluorescence correlation spectroscopy (FCS) experiments in thin liquid films at reflecting substrates. This approach then is used to investigate structure and dynamics in 100-nm-thick 8CB liquid crystal films on silicon wafers with five different oxide thicknesses. We find a different extension of the structural reorientation of 8CB at the solid-liquid interface for thin and for thick oxide. For the thin oxides, the perylenediimide tracer diffusion dynamics in general agrees with the hydrodynamic modeling using no-slip boundary conditions with only a small deviation close to the substrate, while a considerably stronger decrease of the interfacial tracer diffusion is found for the thick oxides.</p>},
  articleno    = {012804},
  author       = {Täuber, Daniela and Radscheit, Kathrin and Von Borczyskowski, Christian and Schulz, Michael and Osipov, Vladimir Al},
  issn         = {1539-3755},
  language     = {eng},
  month        = {07},
  number       = {1},
  publisher    = {American Physical Society},
  series       = {Physical Review E - Statistical, Nonlinear, and Soft Matter Physics},
  title        = {Fluorescence correlation spectroscopy in thin films at reflecting substrates as a means to study nanoscale structure and dynamics at soft-matter interfaces},
  url          = {http://dx.doi.org/10.1103/PhysRevE.94.012804},
  volume       = {94},
  year         = {2016},
}