Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters
(2005) In Surface Science 594(1-3). p.12-19- Abstract
- The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/214102
- author
- Lundwall, M ; Tchaplyguine, Maxim LU ; Ohrwall, G ; Lindblad, A ; Peredkov, Sergey LU ; Rander, T ; Svensson, S and Bjorneholm, O
- organization
- publishing date
- 2005
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- photoelectron, Auger ejection, photoelectron spectroscopy, spectroscopy, Auger electron, surface sensitivity, effective attenuation length-, synchrotron radiation photoelectron spectroscopy, emission
- in
- Surface Science
- volume
- 594
- issue
- 1-3
- pages
- 12 - 19
- publisher
- Elsevier
- external identifiers
-
- wos:000232992100002
- scopus:27144484440
- ISSN
- 0039-6028
- DOI
- 10.1016/j.susc.2005.07.007
- language
- English
- LU publication?
- yes
- id
- aeeea176-a399-4455-8ef8-4ed92c996a10 (old id 214102)
- date added to LUP
- 2016-04-01 16:48:15
- date last changed
- 2022-01-28 22:17:40
@article{aeeea176-a399-4455-8ef8-4ed92c996a10, abstract = {{The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.}}, author = {{Lundwall, M and Tchaplyguine, Maxim and Ohrwall, G and Lindblad, A and Peredkov, Sergey and Rander, T and Svensson, S and Bjorneholm, O}}, issn = {{0039-6028}}, keywords = {{photoelectron; Auger ejection; photoelectron spectroscopy; spectroscopy; Auger electron; surface sensitivity; effective attenuation length-; synchrotron radiation photoelectron spectroscopy; emission}}, language = {{eng}}, number = {{1-3}}, pages = {{12--19}}, publisher = {{Elsevier}}, series = {{Surface Science}}, title = {{Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters}}, url = {{http://dx.doi.org/10.1016/j.susc.2005.07.007}}, doi = {{10.1016/j.susc.2005.07.007}}, volume = {{594}}, year = {{2005}}, }