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Applications of X-ray fluorescence microscopy with synchrotron radiation : From biology to materials science

Sala, Simone ; Rengefors, Karin LU ; Kiventerä, Jenni ; Patanen, Minna ; Gefors, Lina LU ; Werdinius, Christian ; Winge, Sofia ; Broberg, Karin LU orcid ; Kalbfleisch, Sebastian LU and Sigfridsson Clauss, Kajsa LU (2025) In Radiation Physics and Chemistry 229.
Abstract

X-ray fluorescence emission spectroscopy is a powerful tool to gain chemical information on a wide variety of samples. Its combination with focused X-ray beams and translation stages enables X-ray fluorescence microscopy, generating quantitative distribution maps for sets of chemical elements, depending on incident photon energy and detector specifications. The use of synchrotron radiation for X-ray fluorescence microscopy has led to unprecedented performance: with the advent of 4th generation synchrotron facilities such as MAX IV, the increase of the achievable incident photon flux has made higher sensitivity and measuring speed possible, while new nanofocus capabilities have enabled nanoscale spatial resolution. Here, an overview of... (More)

X-ray fluorescence emission spectroscopy is a powerful tool to gain chemical information on a wide variety of samples. Its combination with focused X-ray beams and translation stages enables X-ray fluorescence microscopy, generating quantitative distribution maps for sets of chemical elements, depending on incident photon energy and detector specifications. The use of synchrotron radiation for X-ray fluorescence microscopy has led to unprecedented performance: with the advent of 4th generation synchrotron facilities such as MAX IV, the increase of the achievable incident photon flux has made higher sensitivity and measuring speed possible, while new nanofocus capabilities have enabled nanoscale spatial resolution. Here, an overview of recent and ongoing research is presented from selected two-dimensional X-ray fluorescence microscopy experiments carried out at NanoMAX, the hard X-ray nanoprobe beamline at MAX IV. Results showcase the technique's versatility, as it is applied to microalgae, human dental tissue and engineered materials.

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organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Chemical imaging, Nanoscale, X-ray fluorescence microscopy
in
Radiation Physics and Chemistry
volume
229
article number
112491
publisher
Elsevier
external identifiers
  • scopus:85213541360
ISSN
0969-806X
DOI
10.1016/j.radphyschem.2024.112491
language
English
LU publication?
yes
additional info
Publisher Copyright: © 2024 The Authors
id
af18e721-1d67-4b0b-bf54-31bf75f8e907
date added to LUP
2025-03-20 13:32:54
date last changed
2025-06-23 12:40:02
@article{af18e721-1d67-4b0b-bf54-31bf75f8e907,
  abstract     = {{<p>X-ray fluorescence emission spectroscopy is a powerful tool to gain chemical information on a wide variety of samples. Its combination with focused X-ray beams and translation stages enables X-ray fluorescence microscopy, generating quantitative distribution maps for sets of chemical elements, depending on incident photon energy and detector specifications. The use of synchrotron radiation for X-ray fluorescence microscopy has led to unprecedented performance: with the advent of 4th generation synchrotron facilities such as MAX IV, the increase of the achievable incident photon flux has made higher sensitivity and measuring speed possible, while new nanofocus capabilities have enabled nanoscale spatial resolution. Here, an overview of recent and ongoing research is presented from selected two-dimensional X-ray fluorescence microscopy experiments carried out at NanoMAX, the hard X-ray nanoprobe beamline at MAX IV. Results showcase the technique's versatility, as it is applied to microalgae, human dental tissue and engineered materials.</p>}},
  author       = {{Sala, Simone and Rengefors, Karin and Kiventerä, Jenni and Patanen, Minna and Gefors, Lina and Werdinius, Christian and Winge, Sofia and Broberg, Karin and Kalbfleisch, Sebastian and Sigfridsson Clauss, Kajsa}},
  issn         = {{0969-806X}},
  keywords     = {{Chemical imaging; Nanoscale; X-ray fluorescence microscopy}},
  language     = {{eng}},
  publisher    = {{Elsevier}},
  series       = {{Radiation Physics and Chemistry}},
  title        = {{Applications of X-ray fluorescence microscopy with synchrotron radiation : From biology to materials science}},
  url          = {{http://dx.doi.org/10.1016/j.radphyschem.2024.112491}},
  doi          = {{10.1016/j.radphyschem.2024.112491}},
  volume       = {{229}},
  year         = {{2025}},
}