Electron spectroscopy of rare-gas clusters irradiated by x-ray free-electron laser pulses from SACLA
Fukuzawa, H. ; Tachibana, T. ; Motomura, K. ; Xu, W. Q. ; Nagaya, K. ; Wada, S. ; Johnsson, Per LU
; Siano, M.
; Mondal, S.
and Ito, Y.
, et al.
(2016)
In Journal of Physics B: Atomic, Molecular and Optical Physics
49(3).
- Abstract
- We have measured electron energy spectra and asymmetry parameters of Ar clusters and Xe clusters illuminated by intense x-rays at 5 and 5.5 keV. A velocity map imaging spectrometer was developed for this purpose and employed at an x-ray free-electron laser facility, SACLA in Japan. The cluster size dependence and the peak fluence dependence of the electron spectra and asymmetry parameters are discussed.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/8728537
- author
- Fukuzawa, H.
; Tachibana, T.
; Motomura, K.
; Xu, W. Q.
; Nagaya, K.
; Wada, S.
; Johnsson, Per
LU
; Siano, M.
; Mondal, S.
and Ito, Y.
, et al. (More)
- Fukuzawa, H.
; Tachibana, T.
; Motomura, K.
; Xu, W. Q.
; Nagaya, K.
; Wada, S.
; Johnsson, Per
LU
; Siano, M.
; Mondal, S.
; Ito, Y.
; Kimura, M.
; Sakai, T.
; Matsunami, K.
; Hayashita, H.
; Kajikawa, J.
; Liu, X-J
; Robert, E.
; Miron, C.
; Feifel, R.
; Marangos, J. P.
; Tono, K.
; Inubushi, Y.
; Yabashi, M.
; Yao, M.
and Ueda, K.
(Less)
- organization
- publishing date
- 2016
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- rare-gas cluster, nanoplasma, XFEL
- in
- Journal of Physics B: Atomic, Molecular and Optical Physics
- volume
- 49
- issue
- 3
- article number
- 034004
- publisher
- IOP Publishing
- external identifiers
-
- wos:000368910900006
- scopus:84955617748
- ISSN
- 0953-4075
- DOI
- 10.1088/0953-4075/49/3/034004
- language
- English
- LU publication?
- yes
- id
- af83c73d-d33b-41f5-a55b-230148e63249 (old id 8728537)
- date added to LUP
- 2016-04-01 15:03:53
- date last changed
- 2022-02-19 22:20:47
@article{af83c73d-d33b-41f5-a55b-230148e63249,
abstract = {{We have measured electron energy spectra and asymmetry parameters of Ar clusters and Xe clusters illuminated by intense x-rays at 5 and 5.5 keV. A velocity map imaging spectrometer was developed for this purpose and employed at an x-ray free-electron laser facility, SACLA in Japan. The cluster size dependence and the peak fluence dependence of the electron spectra and asymmetry parameters are discussed.}},
author = {{Fukuzawa, H. and Tachibana, T. and Motomura, K. and Xu, W. Q. and Nagaya, K. and Wada, S. and Johnsson, Per and Siano, M. and Mondal, S. and Ito, Y. and Kimura, M. and Sakai, T. and Matsunami, K. and Hayashita, H. and Kajikawa, J. and Liu, X-J and Robert, E. and Miron, C. and Feifel, R. and Marangos, J. P. and Tono, K. and Inubushi, Y. and Yabashi, M. and Yao, M. and Ueda, K.}},
issn = {{0953-4075}},
keywords = {{rare-gas cluster; nanoplasma; XFEL}},
language = {{eng}},
number = {{3}},
publisher = {{IOP Publishing}},
series = {{Journal of Physics B: Atomic, Molecular and Optical Physics}},
title = {{Electron spectroscopy of rare-gas clusters irradiated by x-ray free-electron laser pulses from SACLA}},
url = {{http://dx.doi.org/10.1088/0953-4075/49/3/034004}},
doi = {{10.1088/0953-4075/49/3/034004}},
volume = {{49}},
year = {{2016}},
}