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SINGLE-SHOT ELECTRON BUNCH PROFILE MONITOR BASED ON COHERENT TRANSITION RADIATION IMAGING

Guisao-Betancur, A. ; Welsch, C. P. ; Wolfenden, J. ; Grimm, O. LU ; Mansten, E. LU ; Thorin, S. LU and Lundquist, J. LU (2025) 14th International Beam Instrumentation Conference, IBIC 2025 In Proceedings of the International Beam Instrumentation Conference, IBIC p.608-611
Abstract

The development of longitudinal diagnostics for short-pulse electron accelerators is challenging but necessary to provide high-brightness electron bunches. This is equally true in novel plasma accelerators and for free electron lasers. The gold standard for such measurements is the transverse deflecting cavity (TDC); however, these devices are typically invasive and costly to produce and operate. As an alternative, a THz-based reflective imaging system has been designed and installed at the MAX IV short pulse facility (SPF) for imaging coherent transition radiation (CTR) for bunch profile reconstruction. This contribution presents the progress towards applying transfer learning to deep learning models for evaluating the reconstruction... (More)

The development of longitudinal diagnostics for short-pulse electron accelerators is challenging but necessary to provide high-brightness electron bunches. This is equally true in novel plasma accelerators and for free electron lasers. The gold standard for such measurements is the transverse deflecting cavity (TDC); however, these devices are typically invasive and costly to produce and operate. As an alternative, a THz-based reflective imaging system has been designed and installed at the MAX IV short pulse facility (SPF) for imaging coherent transition radiation (CTR) for bunch profile reconstruction. This contribution presents the progress towards applying transfer learning to deep learning models for evaluating the reconstruction of bunch profiles from experimentally acquired CTR images, building on previous successes in profile prediction using simulated data. Practical resolution limits and the next steps in the development of the monitor are also discussed, where the reconstructions of the longitudinal profile will be achieved using single-shot CTR images and benchmarked against the TDC bunch profiles.

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author
; ; ; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Proceedings of the 14th International Beam Instrumentation Conference
series title
Proceedings of the International Beam Instrumentation Conference, IBIC
editor
Kumar, Narender
pages
4 pages
publisher
JACoW Publishing, Geneva, Switzerland
conference name
14th International Beam Instrumentation Conference, IBIC 2025
conference location
Liverpool, United Kingdom
conference dates
2025-09-07 - 2025-09-11
external identifiers
  • scopus:105038421260
ISSN
2673-5350
ISBN
9783954502622
DOI
10.18429/JACoW-IBIC2025-WEPCO01
language
English
LU publication?
yes
id
ba95b4fd-f6fd-4317-b85f-e849462687fc
date added to LUP
2026-07-09 13:08:03
date last changed
2026-07-09 13:09:13
@inproceedings{ba95b4fd-f6fd-4317-b85f-e849462687fc,
  abstract     = {{<p>The development of longitudinal diagnostics for short-pulse electron accelerators is challenging but necessary to provide high-brightness electron bunches. This is equally true in novel plasma accelerators and for free electron lasers. The gold standard for such measurements is the transverse deflecting cavity (TDC); however, these devices are typically invasive and costly to produce and operate. As an alternative, a THz-based reflective imaging system has been designed and installed at the MAX IV short pulse facility (SPF) for imaging coherent transition radiation (CTR) for bunch profile reconstruction. This contribution presents the progress towards applying transfer learning to deep learning models for evaluating the reconstruction of bunch profiles from experimentally acquired CTR images, building on previous successes in profile prediction using simulated data. Practical resolution limits and the next steps in the development of the monitor are also discussed, where the reconstructions of the longitudinal profile will be achieved using single-shot CTR images and benchmarked against the TDC bunch profiles.</p>}},
  author       = {{Guisao-Betancur, A. and Welsch, C. P. and Wolfenden, J. and Grimm, O. and Mansten, E. and Thorin, S. and Lundquist, J.}},
  booktitle    = {{Proceedings of the 14th International Beam Instrumentation Conference}},
  editor       = {{Kumar, Narender}},
  isbn         = {{9783954502622}},
  issn         = {{2673-5350}},
  language     = {{eng}},
  pages        = {{608--611}},
  publisher    = {{JACoW Publishing, Geneva, Switzerland}},
  series       = {{Proceedings of the International Beam Instrumentation Conference, IBIC}},
  title        = {{SINGLE-SHOT ELECTRON BUNCH PROFILE MONITOR BASED ON COHERENT TRANSITION RADIATION IMAGING}},
  url          = {{http://dx.doi.org/10.18429/JACoW-IBIC2025-WEPCO01}},
  doi          = {{10.18429/JACoW-IBIC2025-WEPCO01}},
  year         = {{2025}},
}