Interpretation and Utility of the Moments of Small-Angle X-Ray Scattering Distributions
Modregger, Peter ; Kagias, Matias LU
; Irvine, Sarah C.
; Brönnimann, Rolf
; Jefimovs, Konstantins
; Endrizzi, Marco
and Olivo, Alessandro
(2017)
In Physical Review Letters
118(26).
- Abstract
Small angle X-ray scattering has been proven to be a valuable method for accessing structural information below the spatial resolution limit implied by direct imaging. Here, we theoretically derive the relation that links the subpixel differential phase signal provided by the sample to the moments of scattering distributions accessible by refraction sensitive X-ray imaging techniques. As an important special case we explain the scatter or dark-field contrast in terms of the sample's phase signal. Further, we establish that, for binary phase objects, the nth moment scales with the difference of the refractive index decrement to the power of n. Finally, we experimentally demonstrate the utility of the moments by quantitatively determining... (More)
Small angle X-ray scattering has been proven to be a valuable method for accessing structural information below the spatial resolution limit implied by direct imaging. Here, we theoretically derive the relation that links the subpixel differential phase signal provided by the sample to the moments of scattering distributions accessible by refraction sensitive X-ray imaging techniques. As an important special case we explain the scatter or dark-field contrast in terms of the sample's phase signal. Further, we establish that, for binary phase objects, the nth moment scales with the difference of the refractive index decrement to the power of n. Finally, we experimentally demonstrate the utility of the moments by quantitatively determining the particle sizes of a range of powders with a laboratory-based setup.
(Less)
- author
- Modregger, Peter
; Kagias, Matias
LU
; Irvine, Sarah C.
; Brönnimann, Rolf
; Jefimovs, Konstantins
; Endrizzi, Marco
and Olivo, Alessandro
- publishing date
- 2017-06-30
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Physical Review Letters
- volume
- 118
- issue
- 26
- article number
- 265501
- publisher
- American Physical Society
- external identifiers
-
- scopus:85021732686
- pmid:28707948
- ISSN
- 0031-9007
- DOI
- 10.1103/PhysRevLett.118.265501
- language
- English
- LU publication?
- no
- additional info
- Publisher Copyright: © 2017 authors.
- id
- bdbb691c-2b6f-42e9-80f5-5374f06168fa
- date added to LUP
- 2023-11-27 09:03:51
- date last changed
- 2024-03-13 16:05:51
@article{bdbb691c-2b6f-42e9-80f5-5374f06168fa,
abstract = {{<p>Small angle X-ray scattering has been proven to be a valuable method for accessing structural information below the spatial resolution limit implied by direct imaging. Here, we theoretically derive the relation that links the subpixel differential phase signal provided by the sample to the moments of scattering distributions accessible by refraction sensitive X-ray imaging techniques. As an important special case we explain the scatter or dark-field contrast in terms of the sample's phase signal. Further, we establish that, for binary phase objects, the nth moment scales with the difference of the refractive index decrement to the power of n. Finally, we experimentally demonstrate the utility of the moments by quantitatively determining the particle sizes of a range of powders with a laboratory-based setup.</p>}},
author = {{Modregger, Peter and Kagias, Matias and Irvine, Sarah C. and Brönnimann, Rolf and Jefimovs, Konstantins and Endrizzi, Marco and Olivo, Alessandro}},
issn = {{0031-9007}},
language = {{eng}},
month = {{06}},
number = {{26}},
publisher = {{American Physical Society}},
series = {{Physical Review Letters}},
title = {{Interpretation and Utility of the Moments of Small-Angle X-Ray Scattering Distributions}},
url = {{http://dx.doi.org/10.1103/PhysRevLett.118.265501}},
doi = {{10.1103/PhysRevLett.118.265501}},
volume = {{118}},
year = {{2017}},
}