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Development of Novel, Radiation-Hard, Ultra-Compact Active Beamstops with Integrated 4-Quadrant X-ray Sensors for Scattering Experiments on High-Brilliance Undulator Beamlines

Trovato, G. ; Nygard, K. LU ; Birri, M. ; Sanchez, D. F. ; Grolimund, D. ; La Rosa, N. ; Moscato, S. and Camarda, M. (2025) 14th International Beam Instrumentation Conference, IBIC 2025 p.659-661
Abstract

Beamstopper-Integrated Sensors (BIS) based on silicon carbide (SiC) represent a novel class of compact, radiation hard devices that combine beam interception with real-time diagnostics. We present the first characterization of four-quadrant BIS designed for simultaneous intensity and position monitoring on synchrotron beamlines. Based on the established reliability of single-pixel BIS as intensity monitors at SLS, we demonstrate quadrant-resolved response and linearity with photon flux, despite minor contacting issues in one channel. These results establish SiC BIS as robust, visible-blind diagnostics, leading the way for deployment of position-sensitive BIS in high-brilliance undulator experiments.

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author
; ; ; ; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Proceedings of the 14th International Beam Instrumentation Conference
editor
Kumar, Narender
pages
3 pages
publisher
JACoW Publishing, Geneva, Switzerland
conference name
14th International Beam Instrumentation Conference, IBIC 2025
conference location
Liverpool, United Kingdom
conference dates
2025-09-07 - 2025-09-11
external identifiers
  • scopus:105038452439
ISBN
9783954502622
DOI
10.18429/JACoW-IBIC2025-WEPCO20
language
English
LU publication?
yes
id
be6df3a7-071d-4b0c-8845-b984ae8790c7
date added to LUP
2026-08-17 12:45:40
date last changed
2026-08-17 13:20:12
@inproceedings{be6df3a7-071d-4b0c-8845-b984ae8790c7,
  abstract     = {{<p>Beamstopper-Integrated Sensors (BIS) based on silicon carbide (SiC) represent a novel class of compact, radiation hard devices that combine beam interception with real-time diagnostics. We present the first characterization of four-quadrant BIS designed for simultaneous intensity and position monitoring on synchrotron beamlines. Based on the established reliability of single-pixel BIS as intensity monitors at SLS, we demonstrate quadrant-resolved response and linearity with photon flux, despite minor contacting issues in one channel. These results establish SiC BIS as robust, visible-blind diagnostics, leading the way for deployment of position-sensitive BIS in high-brilliance undulator experiments.</p>}},
  author       = {{Trovato, G. and Nygard, K. and Birri, M. and Sanchez, D. F. and Grolimund, D. and La Rosa, N. and Moscato, S. and Camarda, M.}},
  booktitle    = {{Proceedings of the 14th International Beam Instrumentation Conference}},
  editor       = {{Kumar, Narender}},
  isbn         = {{9783954502622}},
  language     = {{eng}},
  pages        = {{659--661}},
  publisher    = {{JACoW Publishing, Geneva, Switzerland}},
  title        = {{Development of Novel, Radiation-Hard, Ultra-Compact Active Beamstops with Integrated 4-Quadrant X-ray Sensors for Scattering Experiments on High-Brilliance Undulator Beamlines}},
  url          = {{http://dx.doi.org/10.18429/JACoW-IBIC2025-WEPCO20}},
  doi          = {{10.18429/JACoW-IBIC2025-WEPCO20}},
  year         = {{2025}},
}