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Influence of plasmons on terahertz conductivity measurements

Nienhuys, Han-Kwang LU and Sundström, Villy LU (2005) In Applied Physics Letters 87(1). p.3-012101
Abstract
Time-domain terahertz spectroscopy allows measuring the complex conductivity spectrum of materials at frequencies on the order of 1 THz. Typically, terahertz (THz) studies produce conductivity spectra that are different from those predicted by the classical Drude model, especially in nanostructured materials. We claim that plasmon resonances in particles that are small compared to the THz wavelength cause these deviations. This is supported by measurements on photoexcited silicon, in bulk as well as in micron-sized particles. In the latter, the behavior is vastly different and strongly dependent on charge carrier concentration.
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author
and
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics Letters
volume
87
issue
1
pages
3 - 012101
publisher
American Institute of Physics (AIP)
external identifiers
  • wos:000230277900022
  • scopus:24144478553
ISSN
0003-6951
DOI
10.1063/1.1977213
language
English
LU publication?
yes
additional info
The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Chemical Physics (S) (011001060)
id
caedb2db-2a9e-42fc-bfaf-46b07d95f2a8 (old id 157812)
date added to LUP
2016-04-01 11:35:12
date last changed
2022-03-20 08:05:44
@article{caedb2db-2a9e-42fc-bfaf-46b07d95f2a8,
  abstract     = {{Time-domain terahertz spectroscopy allows measuring the complex conductivity spectrum of materials at frequencies on the order of 1 THz. Typically, terahertz (THz) studies produce conductivity spectra that are different from those predicted by the classical Drude model, especially in nanostructured materials. We claim that plasmon resonances in particles that are small compared to the THz wavelength cause these deviations. This is supported by measurements on photoexcited silicon, in bulk as well as in micron-sized particles. In the latter, the behavior is vastly different and strongly dependent on charge carrier concentration.}},
  author       = {{Nienhuys, Han-Kwang and Sundström, Villy}},
  issn         = {{0003-6951}},
  language     = {{eng}},
  number       = {{1}},
  pages        = {{3--012101}},
  publisher    = {{American Institute of Physics (AIP)}},
  series       = {{Applied Physics Letters}},
  title        = {{Influence of plasmons on terahertz conductivity measurements}},
  url          = {{http://dx.doi.org/10.1063/1.1977213}},
  doi          = {{10.1063/1.1977213}},
  volume       = {{87}},
  year         = {{2005}},
}