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Off-axis reflection zone plate for quantitative soft x-ray source characterization

Wilhein, T ; Hambach, D ; Niemann, B ; Berglund, M ; Rymell, Lars LU and Hertz, H. M (1997) In Applied Physics Letters 71(2). p.190-192
Abstract
A compact system for high-resolution spectroscopy and quantitative photon flux and brilliance measurements of pulsed soft x-ray sources is described. The calibrated system combines a novel elliptical off-axis reflection zone plate with charge-coupled device detection for simultaneous spectral and spatial measurements. Experiments on a water-window droplet-target laser-plasma source demonstrate lambda/Delta lambda greater than or equal to 1000 spectral resolution and absolute flux and brilliance measurements. (C) 1997 American Institute of Physics.
Please use this url to cite or link to this publication:
author
; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics Letters
volume
71
issue
2
pages
190 - 192
publisher
American Institute of Physics (AIP)
external identifiers
  • scopus:0031192537
ISSN
0003-6951
DOI
10.1063/1.119497
language
English
LU publication?
yes
id
d23addda-647c-4e3c-8836-cdad84d4de1e (old id 2259754)
date added to LUP
2016-04-04 07:01:39
date last changed
2022-01-29 01:38:43
@article{d23addda-647c-4e3c-8836-cdad84d4de1e,
  abstract     = {{A compact system for high-resolution spectroscopy and quantitative photon flux and brilliance measurements of pulsed soft x-ray sources is described. The calibrated system combines a novel elliptical off-axis reflection zone plate with charge-coupled device detection for simultaneous spectral and spatial measurements. Experiments on a water-window droplet-target laser-plasma source demonstrate lambda/Delta lambda greater than or equal to 1000 spectral resolution and absolute flux and brilliance measurements. (C) 1997 American Institute of Physics.}},
  author       = {{Wilhein, T and Hambach, D and Niemann, B and Berglund, M and Rymell, Lars and Hertz, H. M}},
  issn         = {{0003-6951}},
  language     = {{eng}},
  number       = {{2}},
  pages        = {{190--192}},
  publisher    = {{American Institute of Physics (AIP)}},
  series       = {{Applied Physics Letters}},
  title        = {{Off-axis reflection zone plate for quantitative soft x-ray source characterization}},
  url          = {{https://lup.lub.lu.se/search/files/5120638/2297706.pdf}},
  doi          = {{10.1063/1.119497}},
  volume       = {{71}},
  year         = {{1997}},
}