Off-axis reflection zone plate for quantitative soft x-ray source characterization
(1997) In Applied Physics Letters 71(2). p.190-192- Abstract
- A compact system for high-resolution spectroscopy and quantitative photon flux and brilliance measurements of pulsed soft x-ray sources is described. The calibrated system combines a novel elliptical off-axis reflection zone plate with charge-coupled device detection for simultaneous spectral and spatial measurements. Experiments on a water-window droplet-target laser-plasma source demonstrate lambda/Delta lambda greater than or equal to 1000 spectral resolution and absolute flux and brilliance measurements. (C) 1997 American Institute of Physics.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2259754
- author
- Wilhein, T ; Hambach, D ; Niemann, B ; Berglund, M ; Rymell, Lars LU and Hertz, H. M
- organization
- publishing date
- 1997
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Applied Physics Letters
- volume
- 71
- issue
- 2
- pages
- 190 - 192
- publisher
- American Institute of Physics (AIP)
- external identifiers
-
- scopus:0031192537
- ISSN
- 0003-6951
- DOI
- 10.1063/1.119497
- language
- English
- LU publication?
- yes
- id
- d23addda-647c-4e3c-8836-cdad84d4de1e (old id 2259754)
- date added to LUP
- 2016-04-04 07:01:39
- date last changed
- 2022-01-29 01:38:43
@article{d23addda-647c-4e3c-8836-cdad84d4de1e, abstract = {{A compact system for high-resolution spectroscopy and quantitative photon flux and brilliance measurements of pulsed soft x-ray sources is described. The calibrated system combines a novel elliptical off-axis reflection zone plate with charge-coupled device detection for simultaneous spectral and spatial measurements. Experiments on a water-window droplet-target laser-plasma source demonstrate lambda/Delta lambda greater than or equal to 1000 spectral resolution and absolute flux and brilliance measurements. (C) 1997 American Institute of Physics.}}, author = {{Wilhein, T and Hambach, D and Niemann, B and Berglund, M and Rymell, Lars and Hertz, H. M}}, issn = {{0003-6951}}, language = {{eng}}, number = {{2}}, pages = {{190--192}}, publisher = {{American Institute of Physics (AIP)}}, series = {{Applied Physics Letters}}, title = {{Off-axis reflection zone plate for quantitative soft x-ray source characterization}}, url = {{https://lup.lub.lu.se/search/files/5120638/2297706.pdf}}, doi = {{10.1063/1.119497}}, volume = {{71}}, year = {{1997}}, }